| Description |
vi, 301 pages : illustrations ; 24 cm |
| Series |
Ellis Horwood workshops |
|
Ellis Horwood series in workshops.
|
| Contents |
5. Test cost modelling. 5.1. Test cost modelling techniques and costs. 5.2. A predictive cost model for automatic test pattern generation -- 6. Economic aspects of testing multi-chip modules and boards. 6.1. Evaluating cost, schedule, and quality issues of a multi-chip module through simulation. 6.2. The use of scan paths in debugging and testing the EPSILON-2 research computer -- 7. Standards and concurrent engineering. 7.1. EDIF Test View: A proposed industry standard for test data interchange. 7.2. Concurrent information systems engineering and quality control with CFS |
|
Profit, liability, and education: influencing factors on the economics of non-testing. The economics of design and test. Creating wealth - through testing? -- 1. Test Economics. 1.1. Economics of ASIC test development. 1.2. Field service strategies: The use of cost models -- 2. The relationship between test and quality. 2.1. Economical predictive testing in manufacturing electronic circuits. 2.2. The economics of an enhanced reliability improvement process. 2.3. DOM: A defect occurrence model for evaluating the life cycle costs of test strategies. 2.4. Aspects of design quality models "To err is human - to correct is divine" -- 3. CAD test tools. 3.1. A solution to test design bottleneck. 3.2. CHEOPS: Cost-driven heuristic for partial scan -- 4. The economics of boundary scan. 4.1. The economics of designing testability into an existing microprocessor board. 4.2. Implementing and managing an 1149 program. 4.3. Economical test sets for bridging faults on printed circuit boards |
| Analysis |
Electronic equipment Testing |
| Notes |
"Papers presented at the First International Workshop on the Economics of Design and Test, held at MCC, Austin, Texas in September 1991"--Introd |
| Bibliography |
Includes bibliographical references and index |
| Subject |
Electronic circuit design -- Congresses.
|
|
Electronic circuits -- Testing -- Congresses.
|
| Genre/Form |
Conference papers and proceedings.
|
| Author |
Abadir, M.
|
|
Ambler, Anthony, 1954-
|
|
Sastry, Sarma.
|
|
International Workshop on the Economics of Design and Test (1st : 1991 : Austin, Tex.)
|
| LC no. |
92021721 |
| ISBN |
0132247674 |
|
