|
|
2005
NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication, and Device Application of Functional Materials (2002 : Algarve, Portugal)
Rating:
|
2020
Gjerdingen, Robert O., author.
New York, NY : Oxford University Press, [2020]
Rating:
|
2009
Buot, Felix A. (Felixberto Alcudia), 1938-
Rating:
|
2006
Foster, A. (Adam Stuart), 1975-
Rating:
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2015
Don Mills, Ont. : Society of Composers, Authors, and Music Publishers of Canada, 1994-2015
Rating:
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|
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2012
Láng, Gyözö G.
Rating:
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2011
Mody, Cyrus C. M. (Cyrus Cawas Maneck), 1974-
Rating:
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2014
O'Connor, Ryan, 1979- author.
Vancouver, BC : UBC Press, 2014
Rating:
|
2016
Singh, Hema, author
Singapore : Springer, [2016]
Rating:
|
2021
Chaudhary, Raghvendra Kumar
Rating:
|
2012
Gault, Baptiste.
New York : Springer, [2012]
Rating:
Request It
|
1999
Hansen, Thorkild, 1965-
Rating:
|
|
|
2010
3rd rev. & extended ed
Rating:
|
|
|
2019
First edition
Bingley, UK : Emerald Publishing Limited, 2019
Rating:
|
1971
Symposium on Energy Dispersion X-ray Analysis: X-ray and Electron Probe Analysis (1963 : Toronto, Ont.)
Philadelphia, Pa. : American Society for Testing and Materials, [1971]
Rating:
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2004
McCann, Bryan, 1968-
Rating:
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1994
Schabas, Ezra, 1924-
Rating:
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2013
Drysdale, John D
Rating:
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|
|
|
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2017
Bottacchi, Stefano, author
Amsterdam, Netherlands : Elsevier, 2017
Rating:
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1962
Symposium Advances in Electron Metallography and Electron Probe Microanalysis (1960-1961 : Atlantic City, N.J.)
Philadelphia, Pa. : American Society for Testing and Materials, 1962
Rating:
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2019
Boca Raton : CRC Press, 2019
Rating:
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2019
First edition
Oxford : Oxford University Press, 2019
Rating:
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|
|
|
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2024
Xia, Fangzhou
Rating:
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2022
[Place of publication not identified] : Naxos Regular CD (NRE), [2022]
Rating:
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|
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2014
Torbianelli, Edoardo, 1970- author.
Leuven : Leuven University Press, 2014
Rating:
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2016
Kolski-Andreaco, Aaron
Cambridge, MA MyJoVE Corp 2016
Rating:
|
2022
Arnold, Bożena, author
Berlin : Springer, [2022]
Rating:
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2011
T︠S︡ukruk, V. V. (Vladimir Vasilʹevich), author.
Weinheim : Wiley, 2011
Rating:
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|
|
|
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2020
Shah, Khurshed Ahmad
Rating:
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2007
Davies, P. R. (Philip Rosser), 1964-
Rating:
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2013
Bentler, Ruth A., author
San Diego : Plural Publishing, Inc, 2013
Rating:
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|
|
|
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2011
International Symposium for Testing and Failure Analysis (37th : 2011 : San Jose, Calif.)
Rating:
|
2019
Harding, Kevin G., author.
Bellingham, Washington (1000 20th St. Bellingham WA 98225-6705 USA) : SPIE, 2019
Rating:
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|
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2009
International Workshop on Electromagnetic Nondestructive Evaluation (13th : 2008 : Seoul, Korea)
Rating:
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2018
Klapetek, Petr
2nd ed
San Diego : Elsevier Science, 2018
Rating:
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