| Description |
xxi, 453 pages : illustrations ; 25 cm |
| Series |
Springer series in surface sciences ; 23 |
|
Springer series in surface sciences ; 23
|
| Contents |
1. Solid Surfaces, Their Structure and Composition / C. Klauber and R. St. C. Smart -- 2. UHV Basics / C. Klauber -- 3. Electron Microscope Techniques for Surface Characterization / P. S. Turner -- 4. Sputter Depth Profiling / B. V. King -- 5. SIMS -Secondary Ion Mass Spectrometry / R. J. MacDonald and B. V. King -- 6. Auger Spectroscopy and Scanning Auger Microscopy / R. Browning -- 7. X-Ray Photoelectron Spectroscopy / M. H. Kibel -- 8. Fourier Transform Infrared Spectroscopy of Surfaces / N. K. Roberts -- 9. Rutherford Backscattering Spectrometry and Nuclear Reaction Analysis / S. H. Sie -- 10. Scanning Tunneling Microscopy / B. A. Sexton -- 11. Low Energy Ion Scattering / D. J. O'Connor -- 12. Reflection High Energy Electron Diffraction / G. L. Price -- 13. Low Energy Electron Diffraction / P. J. Jennings -- 14. Ultraviolet Photoelectron System of Solids / R. Leckey -- 15. Spin Polarized Electron Techniques / J. L. Robins -- 16. Materials Technology / R. St. C. Smart |
|
17. Characterization of Catalysts by Surface Analysis / B. G. Baker -- 18. Applications to Devices and Device Materials / J. M. Dell and G. L. Price -- 19. Characterization of Oxidized Surfaces / J. L. Cocking and G. R. Johnston -- 20. Coated Steel / R. Payling -- 21. Thin Film Analysis / G. C. Morris -- 22. Identification of Adsorbed Species / B. G. Baker -- Appendix: Acronyms Used in Surface and Thin Film Analysis / C. Klauber -- Surface Science Bibliography |
| Notes |
includes index |
| Bibliography |
Includes bibliographical references (pages 439-445) and index |
| Subject |
Surfaces (Technology) -- Analysis.
|
| Author |
O'Connor, D. J. (D. John), 1952-
|
|
Sexton, B. A. (Brett A.), 1950-
|
|
Smart, R. St. C. (Roger St. C.), 1944-
|
| LC no. |
91018390 |
| ISBN |
0387536116 (Springer-Verlag New York : alk. paper) |
|
3540536116 (Springer-Verlag Berlin : alk. paper) |
|
