Title Atomic scale characterization and first-principles studies of Si₃N₄ interfaces / Weronika Walkosz

Published New York : Springer, ©2011

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Description 1 online resource (xiii, 108 pages) : illustrations Series Springer theses Springer theses. Contents Machine generated contents note: 1. Silicon Nitride Ceramics -- 1.1. Introduction -- 1.2. Overview of Previous Studies on Si3N4 -- 1.3. Overview of the Present Study -- References -- 2. Theoretical Methods and Approximations -- 2.1. Born Oppenheimer Approximation -- 2.2. Density Functional Theory -- 2.3. Approximations for the Exchange-Correlation Energy Functional -- 2.4. Periodic Systems: Bloch's Theorem -- 2.5. k-Point Sampling -- 2.6. Plane Waves, Pseudopotentials, and the Projector Augumented Wave Method -- 2.7. Aperiodic Structures -- 2.8. DFT+U -- References -- 3. Overview of Experimental Tools -- 3.1. Conventional Transmission Electron Microscope -- 3.2. High-Resolution TEM -- 3.3. Image Simulations -- 3.4. Z-contrast Imaging in STEM -- 3.5. Annular Bright-Field Imaging in STEM -- 3.6. Probe Formation -- 3.7 Notes University of Illinois Bibliography Includes bibliographical references and index Notes English Print version record Subject Interfaces (Physical sciences) Condensed matter. Chimie. Science des matériaux. Condensed matter Interfaces (Physical sciences) Genre/Form dissertations. Academic theses Academic theses. Thèses et écrits académiques. Form Electronic book ISBN 9781441978172 1441978178

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