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Book Cover
Book
Author Hsieh, Jiang.

Title Computed tomography : principles, design, artifacts, and recent advances / Jiang Hsieh
Edition Second edition
Published Bellingham, Wash. : SPIE ; Hoboken, N.J. : Wiley, [2009]
©2009

Copies

Location Call no. Vol. Availability
 W'PONDS  616.07572 Hsi/Ctp 2009  AVAILABLE
 W'PONDS  616.07572 Hsi/Ctp 2009  AVAILABLE
Description xiv, 556 pages : illustrations ; 26 c
Series SPIE Press monograph ; PM188
SPIE monograph ; PM188
Contents Preliminaries -- Image reconstruction -- Image presentation -- Key performance parameters of a CT scanner -- Major components of CT scanner -- Image artifacts : appearances, causes, and corrections -- Computer simulation and analysis -- Helical or spiral CT -- Multi-slice CT -- X-ray dose and reduction techniques -- Advanced CT applications
Summary X-ray computed tomography (CT) continues to experience rapid growth, both in basic technology and new clinical applications. Seven years after its first edition, Computed Tomography: Principles, Design, Artifacts, and Recent Advancements, Second Edition, provides an overview of the evolution of CT, the mathematical and physical aspects of the technology, and the fundamentals of image reconstruction algorithms. Image display is examined from traditional methods used through the most recent advancements. Key performance indices, theories behind the measurement methodologies, and different measurement phantoms in image quality are discussed. The CT scanner is broken down into components to provide the reader with an understanding of their function, their latest advances, and their impact on the CT system. General descriptions and different categories of artifacts, their causes, and their corrections are considered at length
Notes "SPIE digital library."
Title from PDF t.p. (viewed on Feb. 25, 2010)
Bibliography Includes bibliographical references and index
Notes Online version available.
Mode of access: World Wide Web
System requirements: Adobe Acrobat Reader
Subject Tomography, X-ray computed
Tomography.
Tomography, X-Ray Computed.
Tomography Scanners, X-Ray Computed -- trends.
Tomography, X-Ray Computed -- instrumentation.
Tomography, X-Ray Computed -- trends.
Author Society of Photo-optical Instrumentation Engineers.
LC no. 2009004797
ISBN 9780470563533 (Wiley)
9780819475336 (SPIE)