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E-book

Title Interfacial compatibility in microelectronics : moving away from the trial and error approach / Tomi Laurila [and others]
Published London ; New York : Springer-Verlag London, ©2012

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Description 1 online resource (ix, 217 pages) : illustrations (some color)
Series Microsystems, 1389-2134
Microsystems (Series)
Contents Introduction: Away from trial and error methods -- Materials and interfaces in Microsystems -- Introduction to mechanics of materials -- Introduction to thermodynamic-kinetic method -- Interfacial adhesion in polymer systems -- Evolution of different types of interfacial structures
Summary Annotation This volume provides solutions to several common reliability issues in microsystem packaging. It teaches the reader methods to understand and predict failure mechanisms at interfaces between dissimilar materials
Analysis Engineering
Optical materials
Surfaces (Physics)
Nanotechnology and Microengineering
Surfaces and Interfaces, Thin Films
Optical and Electronic Materials
oppervlakten
surfaces
grensvlak
interface
optische instrumenten
optical instruments
optica
optics
nanotechnologie
nanotechnology
Engineering (General)
Techniek (algemeen)
Bibliography Includes bibliographical references and index
Notes English
Subject Microelectronics.
Miniaturization
microelectronics.
TECHNOLOGY & ENGINEERING -- Electronics -- Digital.
TECHNOLOGY & ENGINEERING -- Electronics -- Microelectronics.
Ingénierie.
Microelectronics
Form Electronic book
Author Laurila, Tomi
ISBN 9781447124702
1447124707
1447124693
9781447124696
9786613575029
661357502X
1280397101
9781280397103