State of the art on post-silicon validation -- Signal selection for visibility enhancement -- Multiplexed tracing for design error -- Tracing for electrical Error -- Reusing test access mechanisms -- Interconnection fabric for flexible tracing -- Interconnection fabric for systematic tracing -- Conclusion
Summary
This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits
