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Author
IEEE International On-Line Testing Symposium
Title
Proceedings / IEEE International On-Line Testing Symposium
Published
Los Alamitos, Calif. : IEEE Computer Society, [2003-]
©2003-
9th (2003)-
Ceased with 21st (2015)
Online access available from:
IEEE Xplore
01 Jan. 2003-
View Resource Record
Copies
Description
Online resource
Prior Title
IEEE International On-Line Testing Workshop. Proceedings (Online). Proceedings
Later Title
IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)
Notes
Title from PDF of original t.p. (IEEE Xplore, viewed May 24, 2007)
Also issued in printing
Mode of access: World Wide Web
Issuing Body
Sponsored by: IEEE Computer Society Test Technology Technical Council
Notes
21st (2015) (IEEE Xplore, viewed September 16, 2020)
Subject
Electronic circuits -- Testing -- Congresses
Online data processing -- Congresses
Electronic circuit design -- Congresses
Error-correcting codes (Information theory) -- Congresses
Form
Electronic journal
Author
Institute of Electrical and Electronics Engineers
IEEE Computer Society. Technical Council on Test Technology
LC no.
2007242231
ISSN
1942-9401
1942-9398
ABBREV TI
Proc. (IEEE Int. On-Line Test. Symp. Online)
OTHER TI
Proceedings (IEEE International On-Line Testing Symposium. Online)
Other Titles
Proceedings (Online)
IOLTS
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