| Description |
1 online resource (xii, 515 pages) : illustrations (some color) |
| Contents |
Electron Microscopy Principles and Fundamentals; Contents; Introduction; 1 Stationary Beam Methods; 2 Scanning Beam Methods; Index |
| Summary |
Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include:. * Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods. * S |
| Bibliography |
Includes bibliographical references and index |
| Notes |
Print version record |
| Subject |
Electron microscopy.
|
| Form |
Electronic book
|
| Author |
Amelinckx, S. (Severin)
|
| ISBN |
3527614559 (electronic bk.) |
|
9783527614554 (electronic bk.) |
|
