| Description |
1 online resource (xix, 758 pages) : illustrations |
| Contents |
Diffraction and the x-ray powder diffractometer -- The TEM and its optics -- Scattering -- Inelastic electron scattering and spectroscopy -- Diffraction from crystals -- Electron diffraction and crystallography -- Diffraction contrast in TEM images -- Diffraction lineshapes -- Patterson functions and diffuse scattering -- High-resolution TEM imaging -- High-resolution STEM imaging -- Dynamical theory |
| Summary |
"This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent advances in resolution of the TEM. This edition is not substantially longer than the second, but all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of diffraction measurements with x-rays, electrons, or neutrons. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. This textbook can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises."--Jacket |
| Bibliography |
Includes bibliographical references (pages 677-689) and index |
| Notes |
English |
|
Print version record |
| In |
OhioLINK electronic book center |
|
SpringerLink |
| Subject |
Materials -- Microscopy.
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Transmission electron microscopy.
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X-ray diffractometer.
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Microscopy, Electron, Transmission
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transmission electron microscopes |
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Transmission electron microscopy.
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X-ray diffractometer.
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Materials -- Microscopy.
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Chimie.
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Science des matériaux.
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Materials -- Microscopy
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Transmission electron microscopy
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X-ray diffractometer
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| Form |
Electronic book
|
| Author |
Howe, James M., 1955-
|
| LC no. |
2007933070 |
| ISBN |
9783540738862 |
|
354073886X |
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3540738851 |
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9783540738855 |
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