The spectrometric analysis of fluorescent X-RAYS, i.e. X-rays emitted after bombarding matter with high energy particles such as PROTONS; ELECTRONS; or higher energy X-rays. Identification of ELEMENTS by this technique is based on the specific type of X-rays that are emitted which are characteristic of the specific elements in the material being analyzed. The characteristic X-rays are distinguished and/or quantified by either wavelength dispersive or energy dispersive methods
The study of the energy of electrons ejected from matter by the photoelectric effect, i.e., as a direct result of absorption of energy from electromagnetic radiation. As the energies of the electrons are characteristic of a specific element, the measurement of the energy of these electrons is a technique used to determine the chemical composition of surfaces
The spectrometric analysis of fluorescent X-RAYS, i.e. X-rays emitted after bombarding matter with high energy particles such as PROTONS; ELECTRONS; or higher energy X-rays. Identification of ELEMENTS by this technique is based on the specific type of X-rays that are emitted which are characteristic of the specific elements in the material being analyzed. The characteristic X-rays are distinguished and/or quantified by either wavelength dispersive or energy dispersive methods
Identification and measurement of ELEMENTS and their location based on the fact that X-RAYS emitted by an element excited by an electron beam have a wavelength characteristic of that element and an intensity related to its concentration. It is performed with an electron microscope fitted with an x-ray spectrometer, in scanning or transmission mode
Identification and measurement of ELEMENTS and their location based on the fact that X-RAYS emitted by an element excited by an electron beam have a wavelength characteristic of that element and an intensity related to its concentration. It is performed with an electron microscope fitted with an x-ray spectrometer, in scanning or transmission mode
The spectrometric analysis of fluorescent X-RAYS, i.e. X-rays emitted after bombarding matter with high energy particles such as PROTONS; ELECTRONS; or higher energy X-rays. Identification of ELEMENTS by this technique is based on the specific type of X-rays that are emitted which are characteristic of the specific elements in the material being analyzed. The characteristic X-rays are distinguished and/or quantified by either wavelength dispersive or energy dispersive methods
The spectrometric analysis of fluorescent X-RAYS, i.e. X-rays emitted after bombarding matter with high energy particles such as PROTONS; ELECTRONS; or higher energy X-rays. Identification of ELEMENTS by this technique is based on the specific type of X-rays that are emitted which are characteristic of the specific elements in the material being analyzed. The characteristic X-rays are distinguished and/or quantified by either wavelength dispersive or energy dispersive methods
Spectrophotometric techniques by which the absorption or emmision spectra of radiation from atoms are produced and analyzed
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Spectrophotometry, Atomic -- methods : Atomic and nuclear surface analysis methods : a novel perspective for the characterization of dental composites / Eugen A. Preoteasa, Elena S. Preoteasa, and Ioana Suciu
2012
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Spectrophotometry -- Congresses. : Advances in standards and methodology in spectrophotometry : papers presented at the first joint meeting of the UV Spectrometry Group of the U.K. and the Council for Optical Radiation Measurements of the U.S.A., Oxford, September 14-17, 1986 / edited by C. Burgess and K.D. Mielenz
Spectroscope -- Calibration -- Congresses : The 2007 ESO Instrument Calibration Workshop : proceedings of the ESO workshop held in Garching, Germany, 23-26 January 2007 / A. Kaufer, F. Kerber (eds.)
