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Subjects (1-4 of 4)
Scanning Probe Microscopy
1

-- See Microscopy, Scanning Probe


Scanning microscopy in which a very sharp probe is employed in close proximity to a surface, exploiting a particular surface-related property. When this property is local topography, the method is atomic force microscopy (MICROSCOPY, ATOMIC FORCE), and when it is local conductivity, the method is scanning tunneling microscopy (MICROSCOPY, SCANNING TUNNELING)
2

-- See Also the narrower term Atomic force microscopy


3

-- See Also the narrower term Near-field microscopy


4

-- See Also the narrower term Scanning tunneling microscopy


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