| Description |
1 online resource (x, 289 pages) : illustrations |
| Contents |
Note continued: 6.3. Bloch Wave Differential Equation Solution -- 6.4. Multislice Solution -- 6.4.1. Formal Operator Solution -- 6.4.2. Finite Difference Solution -- 6.4.3. Free Space Propagation -- 6.5. Multislice Interpretation -- 6.6. Multislice Method and FFT's -- 6.7. Slicing the Specimen -- 6.8. Aliasing and Bandwidth -- 6.9. Interfaces and Defects -- 6.10. Multislice Implementation -- 6.10.1. Propagator Function and Specimen Tilt -- 6.10.2. Convergence Tests -- 6.10.3. Partial Coherence in BF-CTEM -- 6.10.4. Parallel Computing -- 6.11. More Accurate Slice Methods -- 6.11.1. Operator Solutions -- 6.11.2. Finite Difference Solutions -- 7.1. Gallium Arsenide -- 7.1.1. BF-CTEM Simulation -- 7.1.2. ADF-STEM Simulation -- 7.1.3. Channeling -- 7.2. Silicon Nitride -- 7.3. CBED Simulations -- 7.4. Thermal Vibrations of the Atoms in the Specimen -- 7.4.1. Silicon 111 CBED with TDS -- 7.4.2. Silicon 110 ADF-STEM with TDS -- 7.5. Specimen Edges or Interfaces -- 7.6. Biological Specimens -- 7.7. Quantitative Image Matching -- 7.8. Troubleshooting (What Can Go Wrong) -- 8.1. Program Organization -- 8.2. Image Display -- 8.3. Programming Language -- 8.3.1. Disk File Format -- 8.4. BF-CTEM Sample Calculations for Periodic Specimens -- 8.4.1. Atomic Potentials -- 8.4.2. Multislice -- 8.4.3. Image Formation -- 8.4.4. Partial Coherence -- 8.5. ADF-STEM Sample Calculations for Periodic Specimens -- 8.6. NonPeriodic Specimens -- 8.6.1. Fixed Beam Calculation -- 8.6.2. Scanned Beam Calculation -- 8.7. Program Display -- 8.8. Program Slicview -- A.1. CTEM -- A.2. STEM -- C.1. Atomic Charge Distribution -- C.2. X-ray Scattering Factors -- C.3. Electron Scattering Factors -- C.4. Parameterization |
| Summary |
Advanced Computing in Electron Microscopy, 2nd Edition, brings together diverse information on image simulation. An invaluable resource, this book provides information on various methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. This text will serve as a great tool for students at the advanced undergraduate or graduate level, as well as experienced researchers in the field. This enhanced second edition includes: -descriptions of new developments in the field -updated references -additional material on aberration corrected instruments and confocal electron microscopy -expanded and improved examples and sections to provide stronger clarity |
| Analysis |
materialen |
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materials |
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elektrotechniek |
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electrical engineering |
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materiaalkunde |
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materials science |
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Engineering (General) |
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Techniek (algemeen) |
| Bibliography |
Includes bibliographical references (pages 271-286) and index |
| Notes |
Print version record |
| Subject |
Electron microscopy -- Computer simulation
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SCIENCE -- Electron Microscopes & Microscopy.
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Electron microscopy -- Computer simulation.
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Chimie.
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Science des matériaux.
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Electron microscopy -- Computer simulation
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| Form |
Electronic book
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| LC no. |
2010931437 |
| ISBN |
9781441965332 |
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1441965335 |
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