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Title Rare earth oxide thin films : growth, characterization, and applications / Marco Fanciulli, Giovanna Scarel (eds.)
Published Berlin ; New York : Springer, ©2007

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Description 1 online resource (xvi, 426 pages) : illustrations
Series Topics in applied physics, 0303-4216 ; v. 106
Topics in applied physics ; v. 106. 0303-4216
Contents Note continued: Electrical characterization of rare earth oxides grown by atomic layer deposition / Sabina Spiga / Claudia Wiemer / Giovanna Scarel / Omar Costa / Marco Fanciulli -- Dielectric properties of rare-earth oxides : general trends from theory / Pietro Delugas / Vincenzo Fiorentini / Alessio Filippetti -- Charge traps in high-k dielectrics : ab initio study of defects in Pr-based materials / Jarek Dabrowski / Andrzej Fleszar / Gunther Lippert / Grzegorz Lupina / Anil Mane / Christian Wenger -- Experimental determination of the band offset of rare earth oxides on various semiconductors / Gabriele Seguini / Michele Perego / Marco Fanciulli -- Band edge electronic structure of transition metal/rare earth oxide dielectrics / Gerald Lucovsky -- Electronic structure and band offset of lanthanide oxides / John Robertson / Ka Xiong -- Electronic structure of rare earth oxides / Leon Petit / Axel Svane / Zdzislawa Szotek / Walter M. Temmerman -- Rare earth oxides in microelectronics / Kuniyuki Kakushima / Kazuo Tsutsui / Sun-Ichiro Ohmi / Parhat Ahmet / V. Ramgopal Rao / Hiroshi Iwai -- Requirements of oxides as gate dielectrics for CMOS devices / Gennadi Bersuker / Peter Zeitzoff -- Rare earth oxides grown by molecular beam epitaxy for ultimate scaling / Athanasios Dimoulas -- magneto-electric properties of RMnO[subscript 3] compounds / Thomas T.M. Palstra
Summary Thin rare earth (RE) oxide films are emerging materials for microelectronic, nanoelectronic, and spintronic applications. The state-of-the-art of thin film deposition techniques as well as the structural, physical, chemical, and electrical properties of thin RE oxide films and of their interface with semiconducting substrates are discussed. The aim is to identify proper methodologies for the development of RE oxides thin films and to evaluate their effectiveness as innovative materials in different applications
Bibliography Includes bibliographical references and indexes
In Springer e-books
Subject Rare earth oxide thin films -- Congresses
Rare earth metals.
Metals, Rare Earth
Nanotechnology -- methods
Electronics -- methods
Surface Properties
Rare earths.
Thin films.
Physique.
Rare earth metals
Rare earth oxide thin films
Genre/Form proceedings (reports)
Conference papers and proceedings
Conference papers and proceedings.
Actes de congrès.
Form Electronic book
Author Fanciulli, M. (Marco)
Scarel, Giovanna.
LC no. 2006935383
ISBN 3540357963
9783540357964
9783540357971
3540357971
1281390879
9781281390875