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Optical pattern recognition.
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2014
AMMDS (Workshop) (2nd : 2014 : Stockholm, Sweden)
Cham : Springer, [2014]
Rating:
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2017
Zhang, David
Cham : Springer, 2017
Rating:
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2006
ACIVS (Conference) (8th : 2006 : Antwerp, Belgium)
Rating:
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2007
ACIVS (Conference) (9th : 2007 : Delft, Netherlands)
Rating:
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2009
ACIVS (Conference) (11th : 2009 : Bordeaux, Nouvelle-Aquitaine, France)
Rating:
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2010
ACIVS (Conference) (12th : 2010 : Sydney, N.S.W.)
Rating:
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2012
ACIVS (Conference) (14th : 2012 : Brno, Czech Republic)
Rating:
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2013
ACIVS (Conference) (15th : 2013 : Poznań, Poland)
Cham : Springer, [2013]
Rating:
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2023
ACIVS (Conference) (21st : 2023 : Kumamoto-shi, Japan)
Cham : Springer, 2023
Rating:
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2005
International Workshop on Biometric Recognition Systems (2005 : Beijing, China)
Rating:
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2012
Brain Inspired Cognitive Systems (Conference) (5th : 2012 : Shenyang, China)
Rating:
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2007
BVAI 2007 (2007 : Naples, Italy)
Rating:
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2011
DPPR 2011 (2011 : Tirunelveli, India)
Rating:
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1999
Lee, S.-W. (Seong-whan)
Singapore ; River Edge, N.J. : World Scientific, [1999]
Rating:
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2014
International Symposium on Neural Networks (11th : 2014 : Hong Kong and Macao, China)
Cham : Springer, [2014]
Rating:
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2014
International Symposium on Visual Computing (10th : 2014 : Las Vegas, Nev.)
Cham : Springer, 2014
Rating:
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2014
International Symposium on Visual Computing (10th : 2014 : Las Vegas, Nev.)
Cham : Springer, 2014
Rating:
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2016
International Symposium on Visual Computing (12th : 2016 : Las Vegas, Nev.)
Cham : Springer, 2016
Rating:
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2007
IEEE International Workshop on Analysis and Modeling of Faces and Gestures (3rd : 2007 : Rio de Janeiro, Brazil)
Rating:
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2005
IEEE International Workshop on Analysis and Modeling of Faces and Gestures (2nd : 2005 : Beijing, China)
Berlin ; New York : Springer, ©2005
Rating:
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2014
EvoApplications (Conference) (17th : 2014 : Granada, Spain)
Heidelberg : Springer, [2014]
Rating:
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2005
International Conference, AVBPA (5th : 2005 : Hilton Rye Town, NY)
Rating:
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2009
Daijin, Kim, 1959-
Rating:
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2017
Schachter, Bruce J. (Bruce Jay), 1946- author.
Second edition
Bellingham, Washington : SPIE, [2017]
Rating:
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2020
Schachter, Bruce J. (Bruce Jay), 1946- author.
Fourth edition
Bellingham, Washington (1000 20th St. Bellingham WA 98225-6705 USA) : SPIE, 2020
Rating:
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2015
Boca Raton, FL : CRC Press/Taylor & Francis Group, [2015]
Rating:
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2004
ICBA 2004 (2004 : Hong Kong, China)
Berlin ; New York : Springer, [2004]
Rating:
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2014
BIOMET (Workshop) (1st : 2014 : Sofia, Bulgaria)
Cham : Springer, [2014]
Rating:
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2005
BVAI 2005 (2005 : Naples, Italy)
Rating:
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2014
Gipp, Béla, author.
Wiesbaden : Springer Vieweg, 2014
Rating:
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1974
Young, Tzay Y., 1933-
New York : American Elsevier Pub. Co., 1974
Rating:
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1996
CPM (Symposium) (7th : 1996 : Laguna Beach, Calif.)
Rating:
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2013
Babu, T. Ravindra.
Rating:
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1993
International Conference on Automatic Image Processing (5th : 1993 : Budapest, Hungary)
Berlin ; New York : Springer-Verlag, ©1993
Rating:
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1995
International Conference on Computer Analysis of Images and Patterns (6th : 1995 : Prague, Czech Republic)
Rating:
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2005
International Conference on Computer Analysis of Images and Patterns (11th : 2005 : Versailles, France)
Rating:
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2007
International Conference on Computer Analysis of Images and Patterns (12th : 2007 : Vienna, Austria)
Rating:
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2009
International Conference on Computer Analysis of Images and Patterns (13th : 2009 : Münster, Germany)
Rating:
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2014
CARE (Workshop) (1st : 2014 : Boston, Mass.)
Cham : Springer, [2014]
Rating:
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1979
Hall, Ernest L.
New York : Academic Press, 1979
Rating:
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2005
International Conference on Computer Recognition Systems (4th : 2005 : Rydzyna, Poland)
Rating:
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1994
European Conference on Computer Vision (3rd : 1994 : Stockholm, Sweden)
Rating:
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1994
European Conference on Computer Vision (3rd : 1994 : Stockholm, Sweden)
Rating:
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