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Book Cover
E-book

Title Opioid use, overuse, and abuse in otolaryngology / edited by Ryan J. Li
Published St. Louis, Missouri : Elsevier, [2022]
©2022

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Description 1 online resource (xiii, 224 pages) : illustrations (chiefly color)
Contents The evolution of perioperative pain management in otolaryngology: head and neck surgery -- Pain management in the care of otolaryngology patients: an anesthesiologist and pain physician's perspective -- Perioperative pain management in rhinology and anterior skull base surgery -- Perioperative pain management in facial plastic and reconstructive surgery -- Perioperative pain management in pediatric otolaryngology: head and neck surgery -- Approach to pain management in otology and neurotology -- Pain management in head and neck cancer -- Nonopioid pain management in otolaryngology: head and neck surgery: the pharmacist's perspective -- Addiction management in the outpatient setting -- International perioperative pain management approaches -- A systems approach to perioperative pain management
Summary "Prescription opioid abuse has become a major issue around the world, especially within the United States and Canada. Surgeons' high rate of opioid prescriptions places them in a critical position of working with patients to manage their pain. Opioid Use, Overuse, and Abuse in Otolaryngology, edited by Dr. Ryan J. Li of Oregon Health and Sciences University, takes a comprehensive, practical look at the national opioid epidemic and provides specific otolaryngology-specific data on chronic opioid usage"--Publisher's description
Bibliography Includes bibliographical references
Notes Description based on online resource; title from resource home page (ClinicalKey, viewed February 4, 2022)
Subject Otolaryngology.
Pain -- Treatment.
Opioid abuse.
Opioids -- Therapeutic use
Otorhinolaryngologic Diseases
Pain Management
Opioid-Related Disorders -- drug therapy
Opioid-Related Disorders
Otolaryngology
Opioid abuse
Opioids -- Therapeutic use
Pain -- Treatment
Form Electronic book
Author Li, Ryan J., editor
ISBN 9780323790178
0323790178