Title Proceedings ... / IEEE Far East Forum on Nondestructive Evaluation/Testing : New Technology and Application

Published Piscataway, NJ : IEEE

Online access available from: IEEE Xplore    01 Jan. 2013- View Resource Record

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Description Online resource Notes Description based on: 11th (2014); title from title page Latest issue consulted: 11th (2014) Subject Nondestructive testing -- Technological innovations -- Congresses Form Electronic journal Author Institute of Electrical and Electronics Engineers LC no. 2017205633 ISSN 2639-4944

ABBREV TI Proc. (IEEE Far East Forum Nondestruct. Eval./Test, New Technol. Appl OTHER TI Proceedings (IEEE Far East Forum on Nondestructive Evaluation/Testing, New Technology & Application) Other Titles Increasingly perfect NDT/E FENDT ..

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