Limit search to available items
Book Cover
Author Klapetek, Petr

Title Quantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology
Edition 2nd ed
Published San Diego : Elsevier Science, 2018
Online access available from:
ScienceDirect eBooks    View Resource Record  


Description 1 online resource (422 pages)
Series Micro and Nano Technologies
Micro & nano technologies.
Contents Intro; Title page; Table of Contents; Copyright; List of Contributors; Preface to the Second Edition; Preface to the First Edition; Chapter 1: Motivation; Abstract; 1.1. Why â#x80;#x9C;Quantitativeâ#x80;#x9D; Scanning Probe Microscopy?; 1.2. What Is Scanning Probe Microscopy?; 1.3. Basic Metrology Concepts; 1.4. Scanning Probe Microscopy and Quantitative Measurements; References; Chapter 2: Instrumentation Principles; Abstract; 2.1. Few Components for a Price of a House?; 2.2. Novel Approaches; References; Chapter 3: Data Models; Abstract; 3.1. From Analog to Digital; 3.2. Data Acquisition Basics
3.3. Image Sampling3.4. Data Storage; 3.5. Mechanical and Thermal Drifts; 3.6. Noise; 3.7. Try It Yourself; 3.8. Tips and Tricks; References; Chapter 4: Basic Data Processing; Abstract; 4.1. A Daily Bread?; 4.2. Data Visualization; 4.3. Local Data Manipulation; 4.4. Global Data Manipulation; 4.5. Multiple Channel Operations; 4.6. Scripting; 4.7. Data Generation; 4.8. Other Freely Available Data Processing Software; 4.9. Uncertainty Related to Data Processing; 4.10. Try It Yourself; 4.11. Tips and Tricks; References; Chapter 5: Dimensional Measurements; Abstract; 5.1. The Easiest Measurement?
5.2. Atomic Force Microscopy Principles5.3. Atomic Force Microscopy Dimensional Data Measurement and Evaluation; 5.4. Atomic Force Microscopy and Quantitative Dimensional Metrology; 5.5. Try It Yourself; 5.6. Tips and Tricks; References; Chapter 6: Force and Mechanical Properties; Abstract; 6.1. What About Forces in Force Microscopy?; 6.2. Forces and Forceâ#x80;#x93;Distance Curves; 6.3. Force Interaction Modeling; 6.4. Quantitative Force Measurements; 6.5. Local Mechanical and Material Properties Mapping; 6.6. Try It Yourself; 6.7. Tips and Tricks; References; Chapter 7: Friction and Lateral Forces
Abstract7.1. What Opposes the Tip Motion?; 7.2. Friction Forces; 7.3. Force Modeling; 7.4. Quantitative Friction Force Measurements; 7.5. Special Modes; 7.6. Try It Yourself; 7.7. Tips and Tricks; References; Chapter 8: Electrostatic Fields; Abstract; 8.1. What Is Above the Sample? See the Invisible!; 8.2. Basic Relations; 8.3. Numerical Modeling; 8.4. Try It Yourself; 8.5. Tips and Tricks; References; Chapter 9: Magnetic Fields; Abstract; 9.1. Magnetic Field Measurements; 9.2. Try It Yourself; 9.3. Tips and Tricks; References; Chapter 10: Local Current Measurements; Abstract
10.1. Where It All Started10.2. Tipâ#x80;#x93;Sample Junction Models; 10.3. Scanning Tunneling Microscopy and Related Methods; 10.4. Conductive Atomic Force Microscopy; 10.5. Piezoresponse Force Microscopy; 10.6. Scanning Electrochemical Microscopy; 10.7. Try It Yourself; 10.8. Tips and Tricks; References; Chapter 11: Thermal Measurements; Abstract; 11.1. Really a Hot Topic?; 11.2. Nano- and Microscale Heat Flow; 11.3. Instrumentation; 11.4. Data Interpretation; 11.5. Try It Yourself; 11.6. Tips and Tricks; References; Chapter 12: Optical Measurements; Abstract; 12.1. Have a Look at Nanoscale
Summary Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this new edition to reflect the progress that has been made in SPM techniques in recent years. New features for this edition include more step-by-step examples, better sample data and more links to related documentation in open source software. Scanning Probe Microscopy (SPM) techniques have the potential to produce information on various local physical properties. Unfortunately, there is still a large gap between what is measured by commercial devices and what could be considered as a quantitative result. This book determines to educate and close that gap. Associated data sets can be downloaded from
Notes 12.2. Fundamental Phenomena
Bibliography Includes bibliographical references and index
Notes Print version record
Subject Scanning probe microscopy.
Nanostructures -- Measurement
Microscopy, Scanning Probe
SCIENCE -- General.
Scanning probe microscopy
Form Electronic book
ISBN 9780128133484