| Description |
1 online resource (xxx, 956 pages) : illustrations |
| Series |
Nanoscience and technology |
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Nanoscience and technology.
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| Contents |
Scanning Probe Microscopy Techniques -- Dynamic Force Microscopy and Spectroscopy Using the Frequency-Modulation Technique in Air and Liquids / Hendrik Hölscher, Daniel Ebeling, Jan-Erik Schmutz, Marcus M. Schäefer ... -- Photonic Force Microscopy: From Femtonewton Force Sensing to Ultra-Sensitive Spectroscopy / O.M. Maragò, P.G. Gucciardi, P.H. Jones -- Polarization-Sensitive Tip-Enhanced Raman Scattering / Pietro Giuseppe Gucciardi, Marc Lamy de La Chapelle, Jean-Christophe Valmalette ... -- Electrostatic Force Microscopy and Kelvin Force Microscopy as a Probe of the Electrostatic and Electronic Properties of Carbon Nanotubes / Thierry Mélin, Mariusz Zdrojek, David Brunel -- Carbon Nanotube Atomic Force Microscopy with Applications to Biology and Electronics / Edward D. de Asis Jr., You Li, Alex J. Austin, Joseph Leung, Cattien V. Nguyen -- Novel Strategies to Probe the Fluid Properties and Revealing its Hidden Elasticity / Laurence Noirez -- Combining Atomic Force Microscopy and Depth-Sensing Instruments for the Nanometer-Scale Mechanical Characterization of Soft Matter / Davide Tranchida, Stefano Piccarolo -- Static and Dynamic Structural Modeling Analysis of Atomic Force Microscope / Yin Zhang, Kevin D Murphy -- Experimental Methods for the Calibration of Lateral Forces in Atomic Force Microscopy / Martin Munz |
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Characterization -- Simultaneous Topography and Recognition Imaging / A. Ebner, L.A. Chtcheglova, J. Preiner, J. Tang, L. Wildling, H.J. Gruber ... -- Structural and Mechanical Mechanisms of Ocular Tissues Probed by AFM / Noël M. Ziebarth, Felix Rico, Vincent T. Moy -- Force-Extension and Force-Clamp AFM Spectroscopies in Investigating Mechanochemical Reactions and Mechanical Properties of Single Biomolecules / Robert Szoszkiewicz -- Multilevel Experimental and Modelling Techniques for Bioartificial Scaffolds and Matrices / F. Consolo, F. Mastrangelo, G. Ciardelli, F.M. Montevecchi, U. Morbiducci, M. Sassi ... -- Quantized Mechanics of Nanotubes and Bundles / Nicola M. Pugno -- Spin and Charge Pairing Instabilities in Nanoclusters and Nanomaterials / Armen N. Kocharian, Gayanath W. Fernando, Chi Yang -- Mechanical Properties of One-Dimensional Nanostructures / Gheorghe Stan, Robert F. Cook -- Colossal Permittivity in Advanced Functional Heterogeneous Materials: The Relevance of the Local Measurements at Submicron Scale / Patrick Fiorenza, Raffaella Lo Nigro, Vito Raineri -- Controlling Wear on Nanoscale / Mario D'Acunto -- Contact Potential Difference Techniques as Probing Tools in Tribology and Surface Mapping / Anatoly Zharin |
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Industrial Applications -- Modern Atomic Force Microscopy and Its Application to the Study of Genome Architecture / Kunio Takeyasu, Hugo Maruyama, Yuki Suzuki, Kohji Hizume, Shige H. Yoshimura -- Near-Field Optical Litography / Eugenio Cefalì, Salvatore Patané, Maria Allegrini -- A New AFM-Based Lithography Method: Thermochemical Nanolithography / Debin Wang, Robert Szoszkiewicz, Vamsi Kodali, Jennifer Curtis, Seth Marder ... -- Scanning Probe Alloying Nanolithography / Luohan Peng, Hyungoo Lee, Hong Liang -- Structuring the Surface of Crystallizable Polymers with an AFM Tip / Cvetelin Vasilev, Günter Reiter, Khalil Jradi, Sophie Bistac, Marjorie Schmitt -- Application of Contact Mode AFM to Manufacturing Processes / Michael A. Giordano, Steven R. Schmid -- Scanning Probe Microscopy as a Tool Applied to Agriculture / Fabio Lima Leite, Alexandra Manzoli, Paulo Sérgio Paula de Herrmann Jr |
| Summary |
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber |
| Bibliography |
Includes bibliographical references and index |
| Notes |
Print version record |
| Subject |
Scanning probe microscopy.
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Nanostructured materials -- Microscopy
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SCIENCE -- Nanoscience.
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Chimie.
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Science des matériaux.
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Scanning probe microscopy
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Nanostrukturiertes Material
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Rastersondenmikroskopie
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| Form |
Electronic book
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| Author |
Bhushan, Bharat, 1949-
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| ISBN |
9783642035357 |
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3642035353 |
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9783642104978 |
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3642104975 |
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9783642104961 |
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3642104967 |
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