Title Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits

Published Piscataway, N.J. : IEEE Service Center Print began in 1988?

Online access available from: IEEE Xplore    01 Jan. 1995- View Resource Record

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Description Online resource Issuing Body Conference for <1995> organized by IEEE Singapore Section, co-sponsored by IEEE Electron Devices Society Notes Description based on: 5th ('95); title from caption (IEEEexplore website, viewed Jan. 8, 2008) Latest issue consulted: 24th (2017) (IEEE Xplore website, viewed August 6, 2020) Subject Integrated circuits -- Design and construction -- Congresses Integrated circuits -- Testing -- Congresses Microelectronics -- Research -- Congresses Form Electronic journal Author Institute of Electrical and Electronics Engineers IEEE Singapore Section IEEE Electron Devices Society LC no. 2009200004 ISSN 1946-1550 1946-1542

ABBREV TI Proc. Int. Symp. Phys. Fail. Analysis Integr. Circuits (Online) OTHER TI Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits (Online) Other Titles IPFA ... proceedings Proceedings of the ... International Symposium on the Physical and Failure Analysis of Integrated Circuits Title on some added title pages: International Symposium on the Physical and Failure Analysis of Integrated Circuits Available from some distributers as: ... IEEE ... International Symposium on the Physical and Failure Analysis of Integrated Circuits

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