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Author
International Symposium on the Physical & Failure Analysis of Integrated Circuits
Title
Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits
Published
Piscataway, N.J. : IEEE Service Center
Print began in 1988?
Online access available from:
IEEE Xplore
01 Jan. 1995-
View Resource Record
Copies
Description
Online resource
Issuing Body
Conference for <1995> organized by IEEE Singapore Section, co-sponsored by IEEE Electron Devices Society
Notes
Description based on: 5th ('95); title from caption (IEEEexplore website, viewed Jan. 8, 2008)
Latest issue consulted: 24th (2017) (IEEE Xplore website, viewed August 6, 2020)
Subject
Integrated circuits -- Design and construction -- Congresses
Integrated circuits -- Testing -- Congresses
Microelectronics -- Research -- Congresses
Form
Electronic journal
Author
Institute of Electrical and Electronics Engineers
IEEE Singapore Section
IEEE Electron Devices Society
LC no.
2009200004
ISSN
1946-1550
1946-1542
ABBREV TI
Proc. Int. Symp. Phys. Fail. Analysis Integr. Circuits (Online)
OTHER TI
Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits (Online)
Other Titles
IPFA ... proceedings
Proceedings of the ... International Symposium on the Physical and Failure Analysis of Integrated Circuits
Title on some added title pages: International Symposium on the Physical and Failure Analysis of Integrated Circuits
Available from some distributers as: ... IEEE ... International Symposium on the Physical and Failure Analysis of Integrated Circuits
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