| Description |
1 online resource (xii, 323 pages) : illustrations |
| Contents |
Introduction -- Physical phenomena relevant to STM and AFM -- Scanning probe microscopes -- Practical aspects of STM and AFM measurements -- Simulations of STM and AFM images -- STM and AFM images of layered inorganic compounds -- STM images associated with point defects of layered inorganic compounds -- Tip-sample interactions -- Surface relaxation in STM and AFM images -- Organic conducting salts -- Organic adsorbates at liquid/solid interfaces -- Self-assembled structures -- Polymers |
| Summary |
Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculat |
| Bibliography |
Includes bibliographical references and index |
| Notes |
Print version record |
| Subject |
Atomic force microscopy.
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Electric insulators and insulation -- Testing.
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Metals -- Surfaces -- Analysis.
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Scanning tunneling microscopy.
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Semiconductors -- Testing.
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Surfaces (Technology) -- Analysis.
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| Form |
Electronic book
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| Author |
Whangbo, Myung-Hwan.
|
| ISBN |
3527615105 (electronic bk.) |
|
3527615113 |
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9783527615100 (electronic bk.) |
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9783527615117 |
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(acid-free and chlorine-free paper) |
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(acid-free and chlorine-free paper) |
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