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Subjects (1-3 of 3)
Metal oxide semiconductors, Complementary -- Reliability
1 2022 Recent advances in PMOS negative bias temperature instability : characterization and modeling of device architecture, material and process impact Singapore : Springer, [2022] Rating: Electronic Resources
2 2014 Reliability of high mobility SiGe channel MOSFETs for future CMOS applications Franco, Jacopo, author Dordrecht : Springer, 2014 Rating: Electronic Resources More...
3 2009 Reliability Wearout Mechanisms in Advanced CMOS Technologies Strong, Alvin W Rating: Electronic Resources
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Recent advances in PMOS negative bias temperature instability : characterization and modeling of device architecture, material and process impact