Title Microelectronics failure analysis : desk reference / edited by Richard J. Ross ; EDFAS, ASM International

Edition 6th ed Published Materials Park, Ohio : ASM International, ©2011

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Description 1 online resource (xi, 660 pages) : illustrations Contents Section 1. Introduction -- section 2. Failure analysis process overviews -- section 3. Failure analysis topics -- section 4. Fault verification and classification -- section 5. Localization techniques -- section 6. Deprocessing and sample preparation -- section 7. Inspection -- section 8. Materials analysis -- section 9. Focused ion beam applications -- section 10. Management and reference information Notes "ASM International, 2011, no. 09110Z"--Page 4 of cover Some online versions lack accompanying media packaged with the printed version Bibliography Includes bibliographical references and indexes Notes Print version record Subject Microelectronics -- Materials -- Testing -- Handbooks, manuals, etc Microelectronics -- Defects -- Testing -- Handbooks, manuals, etc Electronic apparatus and appliances -- Testing -- Handbooks, manuals, etc Electronics -- Materials -- Testing -- Handbooks, manuals, etc Electronics -- Materials -- Defects -- Handbooks, manuals, etc Electronics -- Materials -- Handbooks, manuals, etc TECHNOLOGY & ENGINEERING -- Electronics -- Digital. TECHNOLOGY & ENGINEERING -- Electronics -- Microelectronics. Electronic apparatus and appliances -- Testing Electronics -- Materials -- Defects Electronics -- Materials -- Testing Microelectronics -- Materials -- Testing Genre/Form handbooks. Handbooks and manuals Handbooks and manuals. Guides et manuels. Form Electronic book Author Ross, Richard J. ASM International. Electronic Device Failure Analysis Society. LC no. 2012359075 ISBN 9781613447598 1613447590 9781615037261 1615037268 9781615037261

Other Titles Microelectronics failure analysis desk reference

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