Title Microelectronics failure analysis : desk reference / edited by the Electronic Device Failure Analysis Society, Desk Reference Committee

Published Materials Park, Ohio : ASM International, ©2004

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Description 1 online resource (xiv, 800 pages) : illustrations Contents Introduction -- Failure analysis process flow -- Failure verification -- Failure mode: failure classifications -- Special devices -- Non-destructive analysis techniques -- Depackaging -- Photon emission (electroluminescence) localization techniques -- Microthermography -- Laser and particle beam-based localization techniques -- Deprocessing -- General imaging techniques -- Local deprocessing and imaging -- Materials analysis techniques -- Important topics for semiconductor devices -- FA techniques/tools roadmaps -- FA operation and management -- Appendix Bibliography Includes bibliographical references and indexes Notes Print version record Subject Microelectronics -- Materials -- Testing -- Handbooks, manuals, etc Microelectronics -- Defects -- Testing -- Handbooks, manuals, etc Electronic apparatus and appliances -- Testing -- Handbooks, manuals, etc Electronics -- Materials -- Testing -- Handbooks, manuals, etc Electronics -- Materials -- Defects -- Handbooks, manuals, etc Electronics -- Materials -- Handbooks, manuals, etc TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- General. TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- Integrated. Electronic apparatus and appliances -- Testing Electronics -- Materials -- Defects Electronics -- Materials -- Testing Microelectronics -- Materials -- Testing Genre/Form handbooks. Handbooks and manuals Handbooks and manuals. Guides et manuels. Form Electronic book Author Electronic Device Failure Analysis Society. Desk Reference Committee ASM International. ISBN 9781615032662 1615032665

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