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Book Cover
E-book
Author Meyer, J. Patrick, author.

Title Applied measurement with jMetrik / J. Patrick Meyer
Published New York, NY : Routledge/Taylor and Francis Group, 2014
©2014

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Description 1 online resource (xviii, 149 pages) : illustrations
Contents Data management -- Item scoring -- Test scaling -- Item analysis -- Reliability -- Differential item functioning -- Rasch measurement -- Polytomous Rasch models -- Plotting item and test characteristics -- IRT scale linking and score equating
Summary "JMetrik is a computer program for implementing classical and modern psychometric methods. It is designed to facilitate work in a production environment and to make advanced psychometric procedures accessible to every measurement practitioner. Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis. Each chapter focuses on a topic in measurement, describes the steps for using jMetrik, and provides one or more examples of conducting an analysis on the topic. Recommendations and guidance for practice is provided throughout the book"--Publisher's description
Bibliography Includes bibliographical references and index
Notes Print version record
SUBJECT jMetrik. http://id.loc.gov/authorities/names/n2014012034
JMetrik
jMetrik fast
Subject Psychometrics -- Data processing.
Psychological tests -- Data processing
Psychological tests.
Electronic data processing.
Computer science.
Psychometrics -- methods
Psychological Tests
Data Interpretation, Statistical
Electronic Data Processing
data processing.
computer science.
PSYCHOLOGY -- Reference.
Psychological tests
Electronic data processing
Computer science
Psychological tests -- Data processing
Psychometrics -- Data processing
Form Electronic book
ISBN 9781136294174
1136294171
9781306874786
1306874785
9780203115190
0203115198
9781136294167
1136294163
9781136294129
1136294120