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Author Haschke, Michael, 1948- author.

Title Laboratory micro-x-ray fluorescence spectroscopy : instrumentation and applications / Michael Haschke
Published Cham : Springer, 2014

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Description 1 online resource
Series Springer series in surface sciences ; volume 55
Springer series in surface sciences ; v. 55
Contents 880-01 XRF-Basics -- Main Components of X-Ray Spectrometers -- Special Requirements for µ-XRF -- Quantification -- Sample Preparation -- Relations to Other Analytical Methods -- Applications
880-01/(S Machine generated contents note: 1. XRF-Basics -- 1.1. Introduction -- 1.2. Interaction of X-rays with Matter Used for Material Characterization -- 1.2.1. Absorption -- 1.2.2. Emission of Fluorescence Radiation -- 1.2.3. Refraction -- 1.2.4. Scattering -- 1.2.5. Diffraction -- 1.3. General Design of X-ray Spectrometers -- References -- 2. Main Components of X-ray Spectrometers -- 2.1. Excitation Source -- 2.1.1. Excitation by Electrons -- 2.1.2. Excitation by Photons -- 2.1.3. X-ray Tubes -- 2.1.4. Conclusions for Excitation in μ-XRF -- 2.2. Primary Optics -- 2.2.1. Basic Properties of X-ray Optics -- 2.2.2. Diffraction Optics -- 2.2.3. Refraction Optics -- 2.2.4. Reflection Zone Plates -- 2.2.5. Optics Based on Total Reflection -- 2.2.6. Comparison of Different Optics for Their Use in μ-XRF -- 2.3. Sample Positioning and Radiation Shielding -- 2.3.1. Special Requirements for Sample Positioning in μ-XRF -- 2.3.2. Image View -- 2.3.3. Spatial Resolution -- 2.3.4. Measurement Media -- 2.4. Secondary Optics: Spectrometer Type -- 2.4.1. Wavelength Dispersive Spectrometers -- 2.4.2. Energy Dispersive Spectrometers -- 2.5. X-ray Detectors -- 2.5.1. Working Principles and Detector Types -- 2.5.2. Generation of an Energy Dispersive Spectrum -- 2.5.3. Energy Resolution -- 2.5.4. Detection Efficiency -- 2.5.5. Development of Energy Dispersive X-ray Detectors -- 2.5.6. Detector Artifacts -- References -- 3. Special Requirements for μ-XRF -- 3.1. History of Position Sensitive Element Analysis -- 3.2. Possibilities for Spatial Resolved XRF -- 3.2.1. Excitation of a Small Sample Area -- 3.2.2. Excitation of a Large Sample Area -- 3.2.3. Confocal Geometry -- 3.3. Instrument Types -- 3.3.1. Spot Generation -- 3.3.2. Excitation Direction -- 3.3.3. Detector Types -- 3.3.4. Measurement Medium -- 3.3.5. Sample Movement -- 3.3.6. Type of the Spectrometer -- 3.3.7. Instruments on the Market -- 3.4. Typical Measurement Modes for μ-XRF -- 3.4.1. Single Point Measurement -- 3.4.2. Mutiple Point Measurement -- 3.4.3. Area Analysis -- 3.4.4. Linescan -- 3.4.5. Mapping -- References -- 4. Quantification -- 4.1. Introduction -- 4.2. Different Types of Quantification -- 4.2.1. Qualitative and Semi-quantitative Methods -- 4.2.2. Quantification Methods -- 4.3. Quantification for μ-XRF -- 4.3.1. Special Conditions -- 4.3.2. Quantification with the Fundamental Parameter Model -- 4.3.3. Summary -- 4.4. Analysis of Coating Systems -- 4.4.1. Principle of Coating Analysis -- 4.4.2. Requirements for Coating Analysis -- 4.4.3. General Equations for Coating Thickness Testing -- 4.4.4. Thickness Ranges for the Coating Measurements -- 4.4.5. Multiple Layer Analysis -- 4.4.6. Accuracy for Coating Analysis -- 4.4.7. Summary -- 4.5. Errors in μ-XRF -- 4.5.1. Characterization of Errors -- 4.5.2. Random Error Contributions -- 4.5.3. Systematic Error Contributions -- 4.5.4. Concept of Uncertainty -- 4.5.5. Possibilities for Improvement of Accuracy -- References -- 5. Sample Preparation -- 5.1. Introduction -- 5.2. Information Depth -- 5.3. Preparation and Presentation of Different Sample Qualities -- 5.3.1. Solid Samples -- 5.3.2. Powder Samples -- 5.3.3. Filter Materials -- 5.3.4. Liquid Samples -- 5.3.5. Archeological Samples -- References -- 6. Relations to Other Analytical Methods -- 6.1. Comparison with Other Micro-Analytical Methods -- 6.1.1. Overview -- 6.1.2. Synchrotron Excited μ-XRF -- 6.1.3. SEM-EDS -- 6.2. Combination of μ-XRF with Other Methods -- 6.2.1. General Remarks -- 6.2.2. SEM-EDS and μ-XRF -- 6.2.3. μ-XRF and μ-XRD -- 6.2.4. Raman Spectroscopy and μ-XRF -- References -- 7. Applications -- 7.1. Point Analysis -- 7.1.1. Analysis of Precious Metal Alloys -- 7.1.2. Coating Thickness Analysis -- 7.1.3. Analysis of Particles and Inclusions -- 7.1.4. Analysis of Restricted Elements in Consumer Goods -- 7.2. Multiple Point Analysis -- 7.2.1. Area Analysis -- 7.2.2. Muliti-point Measurements -- 7.2.3. High Throughput Screening -- 7.3. One Dimensional Distribution Analysis: LineScan -- 7.3.1. Determination of Diffusion Profiles -- 7.3.2. Analysis of Gems -- 7.3.3. Examination of Roll Bearings -- 7.3.4. Analysis of Sediment Bore Cores -- 7.4. Two Dimensional Distribution Analysis: Mapping -- 7.4.1. Analysis of Geological Samples -- 7.4.2. Examination of Art Objects -- 7.4.3. Life Science Applications -- 7.4.4. Electronics -- 7.4.5. Material Analysis -- 7.4.6. Forensic Applications -- 7.5. Three Dimensional Distribution Analysis -- 7.5.1. Destructive 3D-Analysis -- 7.5.2. Measurements with Confocal Geometry -- References -- 8. Prospectives for μ-XRF -- 8.1. lnstrumentaion -- 8.2. Instrument Control and Data Evaluation -- Reference
Summary Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a µ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions
Analysis oppervlakten
surfaces
grensvlak
interface
oppervlakteverschijnselen
surface phenomena
spectroscopie
spectroscopy
microscopie
microscopy
spectrometrie
spectrometry
meting
measurement
meettechnieken
measurement techniques
fysica
physics
Physics (General)
Fysica (algemeen)
Bibliography Includes bibliographical references and index
Notes Print version record
Subject X-ray spectroscopy.
X-ray microanalysis.
X-ray spectroscopy -- Instruments
X-ray microanalysis -- Instruments
Inhomogeneous materials -- Analysis
Spectrometry, X-Ray Emission
x-ray spectroscopy.
TECHNOLOGY & ENGINEERING -- Mechanical.
Physique.
Astronomie.
X-ray microanalysis.
X-ray spectroscopy.
X-ray spectroscopy -- Instruments.
Genre/Form Electronic books
Form Electronic book
ISBN 9783319048642
3319048643
3319048635
9783319048635
9783319048659
3319048651
9783319353029
3319353020