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Book Cover
E-book
Author Verma, H. R.

Title Atomic and nuclear analytical methods : XRF, Mössbauer, XPS, NAA and ion-beam spectroscopic techniques / H.R. Verma
Published Berlin ; New York : Springer, ©2007

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Description 1 online resource (xiv, 375 pages) : illustrations
Contents X-ray Fluorescence (XRF) and Particle-Induced X-ray Emission (PIXE) -- Rutherford Backscattering Spectroscopy -- Elastic Recoil Detection -- Mössbauer Spectroscopy (MS) -- X-Ray Photoelectron Spectroscopy -- Neutron Activation Analysis -- Nuclear Reaction Analysis and Particle-Induced Gamma-Ray Emission -- Accelerator Mass Spectrometry (AMS)
Summary Features a blend of analytical methods based on the phenomenon of atomic and nuclear physics. This book comprises comprehensive presentations about: X-ray Fluorescence (XRF); Mossbauer Spectroscopy (MS); X-ray Photoelectron Spectroscopy (XPS); Neutron- Activation Analysis (NAA); Particle Induced X-ray Emission Analysis (PIXE); and more
Analysis fysica
physics
materialen
materials
condenseren
condensation
instrumentatie
instrumentation
analytische scheikunde
analytical chemistry
kernfysica
nuclear physics
materiaalkunde
materials science
elektromagnetisme
electromagnetism
optica
optics
meettechnieken
measurement techniques
Physics (General)
Fysica (algemeen)
Bibliography Includes bibliographical references (pages 341-364) and index
Notes Print version record
Subject Spectrum analysis.
Particles (Nuclear physics)
Elementary Particles
particle physics.
SCIENCE -- Physics -- Optics & Light.
Particles (Nuclear physics)
Spectrum analysis.
Physique.
Particles (Nuclear physics)
Spectrum analysis.
Form Electronic book
ISBN 9783540302797
3540302794
3540302778
9783540302773
9786610853243
661085324X