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Subjects (1-2 of 2)
Electronics -- Testing
1
2011
Advanced measurement and test : selected, peer reviewed papers from the 2011 International Conference on Advanced Measurement and Test (AMT 2011), June 24-26, 2011, Nanchang, China
International Conference on Advanced Measurement and Test (2011 : Nanchang, China)
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Electronic Resources
2
1996
Modern electronic test and measuring instruments
Kularatna, N
London : Institution of Electrical Engineers, [1996]
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621.381548 Kul/Met
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