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Electronic apparatus and appliances -- Testing -- Congresses
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1997
International Symposium for Testing and Failure Analysis (23rd : 1997 : Santa Clara, Calif.)
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1998
International Symposium for Testing and Failure Analysis (24th : 1998 : Dallas, Tex.)
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2001
International Symposium for Testing and Failure Analysis (27th : 2001 : Santa Clara, Calif.)
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2003
International Symposium for Testing and Failure Analysis (29th : 2003 : Santa Clara, Calif.)
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2005
International Symposium for Testing and Failure Analysis (31st : 2005 : San Jose, Calif.)
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2006
International Symposium for Testing and Failure Analysis (23rd : 2006 : Austin, Tex.)
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2007
International Symposium for Testing and Failure Analysis (33rd : 2007 : San Jose, Calif.)
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2008
International Symposium for Testing and Failure Analysis (34th : 2008 : Portland, Or.)
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2009
INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS (35TH: 2009: SAN JOSE, CALIF.)
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2010
International Symposium for Testing and Failure Analysis (36th : 2010 : Dallas, Tex.)
Materials Park, Ohio : ASM International, 2010
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2011
International Symposium for Testing and Failure Analysis (37th : 2011 : San Jose, Calif.)
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2012
International Symposium for Testing and Failure Analysis (38th : 2012 : Phoenix Convention Center)
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2013
International Symposium for Testing and Failure Analysis (39th : 2013 : San Jose, Calif.)
Materials Park, Ohio : ASM International, 2013
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2014
International Symposium for Testing and Failure Analysis (40th : 2014 : Houston, Tex.)
Materials Park, Ohio : ASM International, 2014
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2015
International Symposium for Testing and Failure Analysis (41st : 2015 : Portland, Or.), issuing body.
Materials Park, Ohio : ASM International, [2015]
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2017
International Symposium for Testing and Failure Analysis (42nd : 2016 : Fort Worth, Tex.)
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2019
International Symposium for Testing and Failure Analysis.
Materials Park : A S M International, 2019
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