Electron donor-acceptor complexes. : Proton-coupled electron transfer : a carrefour of chemical reactivity traditions / edited by Sebastia̋o Formosinho, Mónica Barroso
Stable elementary particles having the smallest known negative charge, present in all elements; also called negatrons. Positively charged electrons are called positrons. The numbers, energies and arrangement of electrons around atomic nuclei determine the chemical identities of elements. Beams of electrons are called CATHODE RAYS
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Electron Flow : Schaum's Biology Problem 6.5: Cyclic Electron Flow / Ella Ingram
Electron gas -- Congresses : Ultra-cold fermi gases : proceedings of the International School of Physics "Enrico Fermi", course CLXIV, Varenna on Lake Como, Villa Monastero, 20-30 June 2006 / ed. by M. Inguscio, W. Ketterle and C. Solomon
2007
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Electron gas -- Electric properties. : Thermodynamics, Gibbs Method and statistical physics of electron gases / Bahram M. Askerov, Sophia R. Figarova
Electron microscopes -- Congresses. : Electron microscopy and strength of crystals : proceedings of the First Berkeley International Materials Conference "The impact of transmission electron microscopy on theories of the strength of crystals", held at the University of California, Berkeley, July 5-8, 1961 / edited by Gareth Thomas, Jack Washburn
Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY
Electron microscopy -- Methodology : Handbook of cryo-preparation methods for electron microscopy / edited by Annie Cavalier, Daniele Spehner, Bruno M. Humbel
Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY
A type of TRANSMISSION ELECTRON MICROSCOPY in which the object is examined directly by an extremely narrow electron beam scanning the specimen point-by-point and using the reactions of the electrons that are transmitted through the specimen to create the image. It should not be confused with SCANNING ELECTRON MICROSCOPY
Electron microscopy -- Technique -- Congresses : XV International Conference on Electron Microscopy : Selected, Peer Reviewed Papers Presented at the XV International Conference on Electron Microscopy EM2014, 15-18 September 2014, Krakow, Poland / edited by Beata Dubiel and Tomasz Moskalewicz
