Description |
xviii, 439 pages : illustrations (some color) ; 24 cm |
Series |
Nanoscience and technology, 1434-4904 |
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Nanoscience and technology.
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Contents |
Introduction / Seizo Morita -- Principle of NC-AFM / Franz J. Giessibl -- Semiconductor surfaces / Seizo Morita, Yasuhiro Sugawara -- Bias dependence of NC-AFM images and tunneling current variations on semiconductor surfaces / Toyoko Arai, Masahiko Tomitori -- Alkali halides / Roland Bennewitz, Martin Bammerlin, Ernst Meyer -- |
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Atomic resolution imaging on fluorides / Michael Reichling, Clemens Barth -- Atomically resolved imaging of a NiO(001) surface / Hirotaka Hosoi ... [et al.] -- Atomic structure, order and disorder on high temperature reconstructed CC-Al₂O₃(0001) / Clemens Barth, Michael Reichling -- NC-AFM imaging of surface recontructions and metal growth on oxides / Chi Lun Pang, Geoff Thornton -- Atoms and molecules on TiO₂(110) and CeO₂(111) surfaces / Ken-ichi Fukui, Yasuhiro Iwasawa -- NC-AFM imaging of adsorbed molecules / Yasuhiro Sugawara -- Organic molecular films / Hirofumi Yamada -- Single-molecule analysis / Akira Sasahara, Hiroshi Onishi -- |
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Low-temperature measurements: Principles, instrumentation, and application / Wolf Allers, Alexander Schwarz, Udo D. Scwarz -- Theory of non-contact atomic force microscopy / Masaru Tsukada ... [et al.] -- Chemical interaction in NC-AFM on semiconductor surfaces / San-Huang Ke ... [et al.] -- Contrast mechanisms on insulating surfaces / Adam Foster ... [et al.] -- Analysis of microscopy and spectroscopy experiments / Hendrik Holscher -- Theory of energy dissipation into surface vibrations / Michel Gauthier, Lev Kantorovich, Masaru Tsukada -- Measurement of dissipation induced by tip-sample interactions / H.J. Hug, A. Baratoff |
Notes |
Formerly CIP. Uk |
Bibliography |
Includes bibliographical references and index |
Subject |
Atomic force microscopy.
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Author |
Wiesendanger, R. (Roland), 1961-
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Meyer, E. (Ernst), 1962-
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Morita, S. (Seizo), 1948-
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LC no. |
2002021665 |
ISBN |
3540431179 cased |
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