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VLSI-SoC : design for reliability, security, and low power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised selected papers / Youngsoo Shin, Chi Ying Tsui, Jae-Joon Kim, Kiyoung Choi, Ricardo Reis (eds.) |
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