| Description |
xxiii, 403 pages : illustrations ; 24 cm |
| Series |
Chemical analysis ; v. 138 |
|
Chemical analysis ; v. 138
|
| Contents |
Ch. 1. Characteristics of X-Radiation -- Ch. 2. The Crystalline State -- Ch. 3. Diffraction Theory -- Ch. 4. Sources for the Generation of X-Radiation -- Ch. 5. Detectors and Detection Electronics -- Ch. 6. Production of Monochromatic Radiation -- Ch. 7. Instruments for the Measurement of Powder Patterns -- Ch. 8. Alignment and Maintenance of Powder Diffractometers -- Ch. 9. Specimen Preparation -- Ch. 10. Acquisition of Diffraction Data -- Ch. 11. Reduction of Data from Automated Powder Diffractometers -- Ch. 12. Qualitative Analysis -- Ch. 13. Quantitative Analysis -- Appendix A: Common X-Ray Wavelengths -- Appendix B: Mass Attenuation Coefficients -- Appendix C: Atomic Weights and Densities -- Appendix D: Crystallographic Classification of the 230 Space Groups |
| Summary |
Introduction to X-ray Powder Diffractometry fully updates the achievements in the field over the past fifteen years and provides a much-needed explanation of the state-of-the-art techniques involved in characterizing materials. It covers the latest instruments and methods, with an emphasis on the fundamentals of the diffractometer, its components, alignment, calibration, and automation. While the material is presented in an orderly progression, beginning with basic concepts and moving on to more complex material, each chapter stands on its own and can be studied independently or used as a professional reference. More than 230 illustrations and tables demonstrate techniques and clarify complex material |
| Notes |
"A Wiley-Interscience publication." |
| Bibliography |
Includes bibliographical references and index |
| Subject |
X-rays -- Diffraction -- Technique.
|
|
X-ray diffractometer.
|
|
Powders -- Optical properties -- Measurement.
|
| Author |
Snyder, R. L. (Robert L.), 1941-
|
| LC no. |
96012039 |
| ISBN |
0471513393 cloth alkaline paper |
|
