| Description |
1 online resource (242 p.) |
| Contents |
Cover -- Title Page -- Copyright -- Contents -- Preface -- List of Specimens -- Part I Introduction -- Chapter 1 Importance of Electromagnetic Field and Its Visualization -- Chapter 2 Maxwell's Equations and Special Relativity -- 2.1 Maxwell's Equations and Electromagnetic Potentials -- 2.2 Maxwell's Equations Formulated Using Special Relativity -- References -- Chapter 3 Basis of Transmission Electron Microscopy -- Part II Principles and Practice -- Chapter 4 Principles of Electron Holography -- 4.1 Types of Electron Holography -- 4.2 Outline of Electron Holography |
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4.3 Comparison of Phase Shifts Due to Scalar and Vector Potentials -- 4.3.1 Phase Shift Due to Scalar Potential -- 4.3.2 Phase Shift Due to Vector Potential -- 4.3.3 Effect of Thickness Change on Phase Shifts Due to Scalar and Vector Potentials -- 4.3.4 Electric Information -- 4.4 Analysis of Reconstructed Phase Images by Computer Simulation -- References -- Chapter 5 Microscope Constitution and Hologram Formation -- 5.1 Basic Constitution of Transmission Electron Microscope -- 5.1.1 Electron Gun System -- 5.1.2 Illumination System -- 5.1.3 Imaging System -- 5.1.3.1 Focal Length |
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5.1.3.2 Spherical Aberration Coefficient -- 5.1.3.3 Chromatic Aberration Coefficient -- 5.1.3.4 Minimum Step of Defocus -- 5.1.4 Observation System -- 5.1.4.1 Television Camera -- 5.1.4.2 Slow-Scan Charge-Coupled Device Camera -- 5.1.5 Operation of Transmission Electron Microscope -- 5.1.5.1 Adjustment of Electron Gun -- 5.1.5.2 Alignment and Astigmatism Correction of Condenser Lenses -- 5.1.5.3 Alignment of Voltage Center and Correction of Objective Lens Astigmatism -- 5.1.5.4 Correction of Intermediate Lens Astigmatism -- 5.1.5.5 Alignment of Projector Lens |
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5.1.5.6 Adjustment of Objective Lens Focus -- 5.2 Biprism System -- 5.3 Coherence Lengths -- 5.4 Formation of Interference Fringes -- 5.4.1 Geometrical-Path Interpretation with Two Virtual Sources -- 5.4.2 Wave-Optical Treatment -- 5.4.2.1 Wave Function at Wire Plane -- 5.4.2.2 Green's Integral Theorem -- 5.4.2.3 Explicit Form of Green's Function -- 5.4.2.4 Intensity Distribution of Interference Fringes -- 5.4.2.5 Stationary Points and Interference Region -- 5.4.2.6 Spacing of Interference Fringes -- 5.5 Simulation of Interference Fringes -- References |
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Chapter 6 Related Techniques and Specialized Instrumentation -- 6.1 Split-Illumination Electron Holography -- 6.2 Dark-Field Electron Holographic Interferometry -- 6.3 Lorentz Microscopy -- 6.3.1 Fresnel Mode (Defocusing Mode) -- 6.3.2 Foucault Mode (In-Focus Mode) -- 6.3.3 Lorentz Microscopy Using Scanning Transmission Electron Microscope -- 6.3.4 Phase Reconstruction Using Transport-of-Intensity Equation -- 6.4 Magnetically Shielded Lens and High-Voltage Electron Microscope -- 6.5 Aberration-Corrected Lens System -- 6.6 Multifunctional Specimen Holders with Piezodriving Probes |
| Notes |
Description based upon print version of record |
|
6.7 Specimen Preparation Techniques |
| Form |
Electronic book
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| Author |
Shindo, Daisuke
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| ISBN |
9783527829705 |
|
3527829709 |
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