| Description |
1 online resource |
| Contents |
Intro -- Advanced Metrology: Freeform Surfaces -- Copyright -- Contents -- Preface -- Acknowledgments -- Chapter 1: Introduction -- 1.1. Introduction -- 1.2. Geometrical variability -- 1.3. Classification of geometrical surfaces -- 1.4. Basic classification of geometrical surface modifications -- 1.5. The ISO system for geometrical products -- 1.6. A brief history of the specification and metrology of geometrical products -- 1.7. Remarks -- References -- Chapter 2: Fundaments for free-form surfaces -- 2.1. Introduction -- 2.2. Free-form surface representation |
|
2.2.1. Free-form surface requirements -- 2.2.2. Surface representation models -- 2.2.3. Discrete surface representations -- 2.2.4. Continuous surface representations -- 2.2.4.1. Subdivision surfaces -- 2.2.4.2. Ruled surfaces -- 2.2.5. Other surfaces methods -- 2.2.5.1. Skinned surfaces or multisection surfaces -- 2.2.5.2. Swept surfaces -- 2.2.5.3. Swung surfaces -- 2.3. Free-form analysis -- 2.3.1. Sampling and reconstruction -- 2.3.1.1. Feature- or attribute-based sampling -- 2.3.1.2. Sampling based on orthogonal functions -- 2.3.1.3. Simplification of meshes -- 2.3.2. Free-form form fitting |
|
2.3.2.1. Nominal form is known -- 2.3.2.2. Nominal form is not known -- 2.3.3. Free-form filtration and multiscale decomposition -- 2.3.3.1. Diffusion filtering -- 2.3.3.2. Morphological filtering -- 2.3.3.3. Segmentation -- 2.3.3.4. Wavelets -- 2.3.4. Free-form analytics -- 2.3.4.1. Form parameters -- 2.3.4.2. Shape parameters -- 2.3.4.3. Surface texture field parameters -- 2.3.4.4. Surface texture feature parameters -- 2.4. Summary -- References -- Chapter 3: Free-form surface sampling -- 3.1. Introduction -- 3.2. The state of the art -- 3.2.1. Primitive surfaces -- 3.2.2. Free-form surfaces |
|
3.2.2.1. Model-adapted sampling strategies -- 3.2.2.2. Self-adaptive sampling strategies -- 3.3. Surface reconstruction -- 3.3.1. Tensor product B-spline reconstruction -- 3.3.2. Delaunay triangulation reconstruction -- 3.4. Curvature based sampling -- 3.4.1. Curve sampling -- 3.4.2. Surface sampling -- 3.5. Adaptive sampling strategy -- 3.5.1. Method description -- 3.5.1.1. Profile adaptive compression sampling -- 3.5.1.2. Areal adaptive scanning -- 3.5.2. Performance validation -- 3.5.2.1. Experimental settings -- 3.5.2.2. Results and discussion -- 3.6. Triangular mesh sampling -- 3.7. Summary |
| Notes |
Includes index |
| Subject |
Metrology.
|
|
Metrology
|
| Form |
Electronic book
|
| Author |
Scott, Paul J
|
| ISBN |
9780128218167 |
|
0128218169 |
|
