| Description |
1 online resource (xi, 209 pages) |
| Series |
Micro and nano technologies series |
| Contents |
Cover -- Title page -- Copyright page -- Table of Contents -- List of Contributors -- Editor Biographies -- 1 -- Scanning Electron Microscopy -- 1 -- Introduction -- 2 -- Scanning Electron Microscope -- 2.1 -- Vacuum -- 2.2 -- Electron Gun -- 2.2.1 -- Filament Types -- 2.3 -- Electron Column -- 2.4 -- Sample Chamber -- 3 -- Using the SEM -- 4 -- Developments in Scanning Electron Microscopy -- 4.1 -- Electric Charge Buildup in the Sample -- 4.2 -- Nanoassembly -- 4.3 -- Electron Detectors -- 5 -- Low-Voltage Scanning Electron Microscopy -- 6 -- Environmental Scanning Electron Microscopy -- 7 -- Electron Backscatter Diffraction -- 8 -- Energy-Dispersive X-Ray Spectroscopy in Scanning Electron Microscopy -- 9 -- Electron Beam Lithography -- 10 -- Nanomanipulation -- List of Symbols -- References -- Further Reading -- 2 -- Atomic Force Microscopy: A Powerful Tool for Electrical Characterization -- 1 -- Introduction -- 2 -- Operating Principles -- 3 -- Operating Modes -- 3.1 -- Contact Mode -- 3.2 -- Intermittent Contact Mode -- 4 -- Image Processing and Analysis -- 5 -- Electrical Nanocharacterization -- 5.1 -- Classification of Operating Regimes -- 5.1.1 -- Scan Modes -- 5.1.2 -- Modulation Schemes -- 5.1.3 -- Types of Configurations -- 5.2 -- Examples of Use -- 5.2.1 -- Electrostatic Force Microscopy -- 5.2.2 -- Scanning Surface Potential Microscopy -- List of Symbols -- References -- 3 -- Spectroscopic Techniques for Characterization of Nanomaterials -- 1 -- Ultraviolet-Visible Absorption -- 1.1 -- Characterization of Materials and Nanoparticles -- 1.2 -- Catalysis -- 1.3 -- Sensors -- 1.4 -- Monitoring the Growth of Nanostructured Films -- 2 -- Fourier Transform Infrared Spectroscopy -- 2.1 -- Molecular Interactions -- 2.2 -- Molecular Orientation -- 3 -- Raman Scattering -- 3.1 -- Carbon-Based Nanomaterials -- 3.2 -- Nanomaterials From Metals -- 4 -- Surface-Enhanced Raman Scattering |
|
4.1 -- Sensor Units and Metallic Nanostructures -- 4.2 -- Electronic Circuits -- 4.3 -- Biological Materials -- 4.4 -- Paintings and Textiles of Historical Value -- List of Symbols -- References -- 4 -- Dynamic Light Scattering Applied to Nanoparticle Characterization -- 1 -- Theory -- 1.1 -- Rayleigh Scattering -- 1.2 -- Brownian Movement and the DLS Technique -- 1.3 -- Analysis of the Distributions -- 2 -- Applications -- List of abbreviations and symbols -- References -- 5 -- X-Ray Diffraction and Scattering by Nanomaterials -- 1 -- X-Ray Diffraction Applied to the Study of Nanocrystalline Powders -- 1.1 -- X-Ray Diffraction -- 1.1.1 -- Introduction -- 1.1.2 -- Kinematic Theory -- 1.2 -- Powder Diffraction Method -- 1.2.1 -- Fundamentals -- 1.2.2 -- Experimental Settings -- 1.3 -- X-ray Power Diffraction Applied to Nanomaterials -- 1.3.1 -- Phase Identification by XPD: Application to Nanomaterials -- 1.3.2 -- Methods for Studying Crystallite Size and Microstrains by Analysis of X-Ray Diffraction Peak Profiles -- 1.3.2.1 -- Williamson-Hall plots and simple cases -- 1.3.2.2 -- The Fourier method of Warren-Averbach -- 1.3.2.3 -- Integral breadth method -- 1.4 -- Rietveld Method and its Application to the Study of Crystallite Size and Microstrains -- 1.5 -- Case Study: Nanocrystalline Y2O3-Doped ZrO2 Powders -- 1.6 -- Modern Methods for Analysis of XPD Data from Nanomaterials -- 2 -- Small-Angle X-Ray Scattering -- 2.1 -- Basic Aspects -- 2.1.1 -- Scattering of X-Rays by Free Electrons -- 2.1.2 -- X-Ray Scattering by a Material Volume with an Arbitrary Structure -- 2.1.3 -- X-Ray Scattering by an Atom -- 2.1.4 -- X-Ray Scattering by a Cluster of Atoms -- 2.1.5 -- Correlation Function Associated With an Arbitrary Structure -- 2.1.6 -- X-Ray Scattering by Isotropic Systems -- 2.2 -- Nanoparticles Immersed in Homogeneous Matrices -- 2.2.1 -- Redefinition of the Correlation Function |
|
2.2.2 -- Proteins in Solution -- 2.3 -- Structural Parameters and Models -- 2.3.1 -- Determination of the Radius of Gyration of Nanoparticles in Dilute Solution -- 2.3.2 -- Determination of the Surface/Volume Ratio of Nanoparticles -- 2.3.3 -- Determination of the Volume of Nanoparticles in Dilute Solution -- 2.4 -- Software for the Analysis of SAXS Curves of Proteins in Solution -- 2.4.1 -- Distance and Size Distribution Functions -- 2.4.2 -- SAXS Curves Determined From High-Resolution Structures -- 2.4.3 -- Ab Initio Determination of Protein Shape From Experimental SAXS Curves -- 2.4.4 -- Determination of the Molecular Mass of Proteins From Experimental SAXS Curves on a Relative Scale -- 2.5 -- Example of Application: Study by SAXS of Leptospira Ferrodoxin-NADP(H) Reductase in Solution -- 3 -- GISAXS and ASAXS -- 3.1 -- Grazing-Incidence X-Ray Scattering -- 3.1.1 -- Refractive Index, Penetration Depth, and Fresnel Reflection and Transmission -- 3.1.1.1 -- Refractive index -- 3.1.1.2 -- Penetration depth -- 3.1.1.3 -- Fresnel equations for X-ray reflection and transmission -- 3.1.2 -- Scattering Vector -- 3.1.3 -- Scattering Intensity due to Nanoparticles Deposited on the Substrate Surface -- 3.1.4 -- Nanoparticles Buried Below the Surface of a Given Substrate -- 3.1.5 -- Examples of GISAXS Application -- 3.1.5.1 -- Cobalt silicide (CoSi2) nanoplatelets buried in monocrystalline silicon -- 3.1.5.2 -- Multilayers of PbTe nanocrystals immersed in SiO2 -- 3.2 -- Anomalous or Resonant Small-Angle X-Ray Scattering -- 3.2.1 -- Atomic Scattering Factor -- 3.2.1.1 -- Atomic scattering factor for photon energies far from those corresponding to the absorption edges -- 3.2.1.2 -- General definition of the atomic scattering factor -- 3.2.2 -- SAXS Intensity for Photon Energies Close to Those of the Absorption Edges -- 3.2.3 -- Structural Analysis With Composition Selectivity |
|
3.2.4 -- Instrumental Aspects -- 3.2.4.1 -- Choice of photon energy -- 3.2.4.2 -- Data correction -- 3.2.4.2.1 -- Normalization of SAXS intensity and subtraction of parasitic scattering -- 3.2.4.2.2 -- Experimental determination of the real part of the correction term of the atomic scattering factor -- 3.2.5 -- Application Example -- References -- 6 -- Surface Plasmon Resonance (SPR) for Sensors and Biosensors -- 1 -- Introduction -- 2 -- Surface Plasmons -- 3 -- Surface Plasmon Resonance-Based Sensors -- 4 -- SPR Applications -- 4.1 -- Materials Characterization -- 4.2 -- Medical Diagnosis -- 4.3 -- Food Quality Sensors -- 4.4 -- Drug Development -- 5 -- Final Remarks -- List of Symbols and Abbreviations -- References -- Index -- Back cover |
| Summary |
Nanocharacterization Techniques covers the main characterization techniques used in nanomaterials and nanostructures. The chapters focus on the fundamental aspects of characterization techniques and their distinctive approaches. Significant advances that have taken place over recent years in refining techniques are covered, and the mathematical foundations needed to use the techniques are also explained in detail. This book is an important reference for materials scientists and engineers looking for a through analysis of nanocharacterization techniques in order to establish which is best for their needs |
| Bibliography |
Includes bibliographical references and index |
| Notes |
Online resource; title from PDF title page (EBSCO, viewed March 23, 2017) |
| Subject |
Nanostructured materials -- Technique
|
|
TECHNOLOGY & ENGINEERING -- Engineering (General)
|
|
TECHNOLOGY & ENGINEERING -- Reference.
|
| Form |
Electronic book
|
| Author |
Leite, Fábio de Lima, editor
|
|
Ferreira, Marystela, editor
|
|
Oliveira, Osvaldo N., editor
|
|
Róz, Alessan Luzia Da, editor
|
| ISBN |
9780323497794 |
|
0323497799 |
|
0323497780 |
|
9780323497787 |
|
