| Description |
1 online resource (310 p.) |
| Series |
Optical Science and Engineering Ser |
|
Optical Science and Engineering Ser
|
| Contents |
Cover -- Half Title -- Series Page -- Title Page -- Copyright Page -- Contents -- Preface to the Second Edition -- About the Author -- 1 Introduction -- 1.1 A general overview -- 1.2 Brief history of CMOS image sensors -- 1.2.1 Competition with CCDs -- 1.2.2 Solid-state imagers with in-pixel amplification -- 1.2.3 Present CMOS image sensors -- 1.3 Brief history of smart CMOS image sensors -- 1.3.1 Vision chips -- 1.3.2 Advancement of CMOS technology and smart CMOS image sensors -- 1.3.3 Smart CMOS image sensors based on high performance CMOS image sensor technologies |
|
1.4 Organization of the book -- 2 Fundamentals of CMOS image sensors -- 2.1 Introduction -- 2.2 Fundamentals of photo-detection -- 2.2.1 Absorption coefficient -- 2.2.2 Behavior of minority carriers -- 2.2.3 Sensitivity and quantum efficiency -- 2.3 Photo-detectors for smart CMOS image sensors -- 2.3.1 pn-junction photodiode -- 2.3.2 Photo-gate -- 2.3.3 Photo-transistor -- 2.3.4 Avalanche photodiode -- 2.3.5 Photo-conductive detector -- 2.4 Accumulation mode in PDs -- 2.4.1 Potential change in accumulation mode -- 2.4.2 Potential description -- 2.4.3 Behavior of photo-generated carriers in PD |
|
2.5 Basic pixel structures -- 2.5.1 Passive pixel sensor -- 2.5.2 Active pixel sensor, 3T-APS -- 2.5.3 Active pixel sensor, 4T-APS -- 2.6 Sensor peripherals -- 2.6.1 Addressing -- 2.6.2 Readout circuits -- 2.6.3 Analog-to-digital converters -- 2.7 Basic sensor characteristics -- 2.7.1 Noise -- 2.7.2 Dynamic range -- 2.7.3 Speed -- 2.8 Color -- 2.8.1 On-chip color filter type -- 2.8.2 Three imagers type -- 2.8.3 Three light sources type -- 2.9 Comparison among pixel architectures -- 2.10 Comparison with CCDs -- 3 Smart structures and materials -- 3.1 Introduction -- 3.2 Smart pixels |
|
3.2.1 Analog mode -- 3.2.2 Pulse modulation mode -- 3.2.3 Digital mode -- 3.3 Smart materials and structures -- 3.3.1 Silicon-on-insulator -- 3.3.2 Extending to NIR region -- 3.3.3 Backside illumination -- 3.3.4 3D integration -- 3.3.5 Smart structure for color detection -- 3.4 Dedicated pixel arrangement and optics for smart CMOS image sensors -- 3.4.1 Phase-difference detection auto focus -- 3.4.2 Hyper omni vision -- 3.4.3 Biologically inspired imagers -- 3.4.4 Light field camera -- 3.4.5 Polarimetric imaging -- 3.4.6 Lensless imaging -- 4 Smart imaging -- 4.1 Introduction |
|
4.2 High sensitivity -- 4.2.1 Dark current reduction -- 4.2.2 Differential APS -- 4.2.3 High conversion gain pixel -- 4.2.4 SPAD -- 4.2.5 Column-parallel processing -- 4.3 High-speed -- 4.3.1 Overview -- 4.3.2 Global shutter -- 4.3.3 Column- and pixel-parallel processing for high speed imaging -- 4.3.4 Ultra-high-speed -- 4.4 Wide dynamic range -- 4.4.1 Overview -- 4.4.2 Nonlinear response -- 4.4.3 Linear response -- 4.5 Demodulation -- 4.5.1 Overview -- 4.5.2 Correlation -- 4.5.3 Method of two accumulation regions -- 4.6 Three-dimensional range finder -- 4.6.1 Overview -- 4.6.2 Time-of-flight |
| Notes |
Description based upon print version of record |
|
4.6.3 Triangulation |
| Form |
Electronic book
|
| ISBN |
9781351652346 |
|
1351652346 |
|
