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Title Machine vision inspection systems. Volume 1, Image Processing, Concepts, Methodologies and Applications / edited by Muthukumaran Malarvel, Soumya Ranjan Nayak, Sury Narayan Panda, Prasant Kumar Pattnaik and Nittaya Muangnak
Published Hoboken, NJ : Wiley-Scrivener, 2020
Online access available from:
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Description 1 online resource
Summary "Machine Vision Inspection Systems (MVIS) is a multidisciplinary research field that emphasizes the image processing, machine vision and pattern recognition for industrial applications. Inspection techniques are generally used in destructive and non-destructive evaluation industry. Recently, the current automated vision research on machine inspection has gained more popularity with researchers and engineers, because the manual assessment of the inspection may fail and turn into false assessment due to a large number of examinations during the inspection process, leading to potential disaster. Machine Vision Inspection Systems (MVIS) is better able to avoid false assessment"-- Provided by publisher
Bibliography Includes bibliographical references and index
Notes Print version record
Subject Computer vision -- Industrial applications
Computer vision.
Engineering inspection -- Automation
Image processing -- Digital techniques.
Image processing.
Computer vision
Computer vision -- Industrial applications
Engineering inspection -- Automation
Image processing
Image processing -- Digital techniques
Form Electronic book
Author Malarvel, Muthukumaran, editor.
Muangnak, Nittaya, editor.
Nayak, Soumya Ranjan, 1984- editor.
Panda, Sury Narayan, editor.
Pattnaik, Prasant Kumar, 1969- editor.
ISBN 1119682045
Other Titles Image Processing, Concepts, Methodologies and Applications