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Authors (Last name first) (1-3 of 3)
Meyer, J. Patrick,
1
2014
Applied measurement with jMetrik
Meyer, J. Patrick, author.
New York, NY : Routledge/Taylor and Francis Group, 2014
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Electronic Resources
2
2010
Reliability
Meyer, J. Patrick.
Oxford ; New York : Oxford University Press, 2010
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3
2010
Reliability
Meyer, J. Patrick
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Electronic Resources
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