| Description |
1 online resource |
| Contents |
A Brief History and State of the Art of Ellipsometry / Eugene A. Irene -- Advanced Mueller Ellipsometry Instrumentation and Data Analysis / Enric Garcia-Caurel, Razvigor Ossikovski, Martin Foldyna -- Data Analysis for Nanomaterials: Effective Medium Approximation, Its Limits and Implementations / Josef Humlicek -- Relationship Between Surface Morphology and Effective Medium Roughness / Angel Yanguas-Gil, Herbert Wormeester -- Plasmonics and Effective-Medium Theory / David E. Aspnes -- Thin Films of Nanostructured Noble Metals / Herbert Wormeester, Thomas W.H. Oates -- Spectroscopic Ellipsometry on Metallic Gratings / Michael Bergmair, Kurt Hingerl, Peter Zeppenfeld -- Ellipsometry at the Nanostructure / Yasuhiro Mizutani, Yukitoshi Otani -- Spectroscopic Ellipsometry and Magneto-Optical Kerr Spectroscopy of Magnetic Garnet Thin Films Incorporating Plasmonic Nanoparticles / Satoshi Tomita -- Generalized Ellipsometry Characterization of Sculptured Thin Films Made by Glancing Angle Deposition / Daniel Schmidt, Eva Schubert, Mathias Schubert -- THz Generalized Ellipsometry Characterization of Highly-Ordered Three-Dimensional Nanostructures / Tino Hofmann, Daniel Schmidt, Mathias Schubert -- Infrared Ellipsometric Investigations of Free Carriers and Lattice Vibrations in Superconducting Cuprates / Jiří Chaloupka, Dominik Munzar, Josef Humlíček -- Real-Time Ellipsometry for Probing Charge-Transfer Processes at the Nanoscale / Maria Losurdo, April S. Brown, Giovanni Bruno -- Polarimetric and Other Optical Probes for the Solid-Liquid Interface / Kurt Hingerl -- Spectroscopic Ellipsometry for Functional Nano-Layers of Flexible Organic Electronic Devices / Stergios Logothetidis, Argiris Laskarakis -- Spectroscopic Ellipsometry of Nanoscale Materials for Semiconductor Device Applications / Alain C. Diebold, Florence J. Nelson, Vimal K. Kamineni -- Ellipsometry of Semiconductor Nanocrystals / Peter Petrik, Miklos Fried -- Spectroscopic Ellipsometry for Inline Process Control in the Semiconductor Industry / Stefan Zollner -- Thin Film Applications in Research and Industry Characterized by Spectroscopic Ellipsometry / Denis Cattelan, Céline Eypert, Marzouk Kloul -- Ellipsometry and Correlation Measurements / Rados Gajic, Milka Jakovljevic -- Nanotechnology: Applications and Markets, Present and Future / Ottilia Saxl |
| Summary |
This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications |
| Analysis |
Engineering |
|
Nanotechnology |
|
Surfaces (Physics) |
|
Nanotechnology and Microengineering |
|
Measurement Science and Instrumentation |
|
nanotechnologie |
|
meting |
|
measurement |
|
meettechnieken |
|
measurement techniques |
|
materialen |
|
materials |
|
materiaalkunde |
|
materials science |
|
Engineering (General) |
|
Techniek (algemeen) |
| Bibliography |
Includes bibliographical references |
| Subject |
Ellipsometry.
|
|
Polarimetry.
|
|
Nanotechnology.
|
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TECHNOLOGY & ENGINEERING -- Engineering (General)
|
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TECHNOLOGY & ENGINEERING -- Reference.
|
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Ingénierie.
|
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Ellipsometry
|
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Nanotechnology
|
|
Polarimetry
|
| Form |
Electronic book
|
| Author |
Losurdo, Maria
|
|
Hingerl, Kurt
|
| ISBN |
9783642339561 |
|
3642339565 |
|
