| Description |
1 online resource (iii, 157 pages) : illustrations |
| Summary |
"X-ray diffractometry (XRD), a nondestructive technique, is an essential scientific tool capable of supplying users with fundamental data and information unobtainable by other techniques, and exhibits increasing usages and attracts intensive attention in modern science and technology. The complete cognition of many potentialities of XRD, however, requires an elementary knowledge of crystallography and X-ray science. Admittedly, certain routine applications of X-ray diffraction demand only little or no familiarity with this field, but most researchers want to go beyond these push-button applications and to use various techniques as powerful aids in both pure and applied research. This e-book aims at: (1) revealing theories and applicable skills of the novel two-dimensional and threedimensional (2D/3D) X-ray diffractometry for the structure characterization of material by providing an intuitive understanding of the description of instruments and methods, as well as a set of general mathematical models; (2) bridging present gaps between the basic texts and the specialist works. Based on asymmetrical-Bragg diffraction geometry which contains basic elements, a set of universal mathematical model has been built up, where two equations on the desired azimuth angle and a common scan mode are included. Compared with the previous literature, unique characters of this technique are: (1) multifunction; (2) simplicity of measurement; (3) depth/azimuth-resolved X-ray patterns for coatings; (4) texture measurement (rather than in the pole-figure method); and (5) profile analysis for size-strain broadening (not in the fitted - profile method). In addition, by reading the corresponding chapters it is possible to obtain many applications in five main fields |
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... This book covers many aspects of 2D and 3D X-ray diffractometry, through suggesting a rational gist, establishing a set of general mathematical models, and extending multi-operation modes, in order to meet the requirements of providing fingerprints and structure characterizations of various materials. The book tries to form the basis of a modern course of XRD. This book includes five parts consisting of fifteen chapters. Part I deals with the general concept of properties of Xrays, structure of crystals, essential knowledge of X-ray diffraction, and principles of superposition of wave motions. Conventional X-ray phase analysis methods of oriented specimens are introduced in Part II. Part III based on principles of the asymmetrical Bragg reflection geometry is the focal point of this work; four formulas are constructed including the intensity equation, azimuth-angle equation, a common scan mode, as well as the Bragg equation. The main applications are stated in Part IV, a new so-called weighted-strain breadth combined with the weighted-mean-dimension is introduced for solving size-strain broadening problems, which makes the profile analysis in straight measurements possible. Part V, Development of Diffraction Theories in XRD, summarizes the multifunctional 1D̃3D XRD in real space and describes the resonance effect demonstrated by Bragg's law."--Preface, p. i-ii |
| Bibliography |
Includes bibliographical references and index |
| Notes |
Mode of access: World Wide Web |
| Subject |
X-rays -- Diffraction
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X-rays -- Diffraction -- Mathematical models
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X-rays -- Diffraction.
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| Form |
Electronic book
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| Author |
Qiuzi, Cong
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Xiang, Yu geoscientist
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Li, He physicist
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| ISBN |
9781608050765 |
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1608050769 |
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