| Description |
1 online resource (xiv, 592 pages) : illustrations |
| Series |
Solid state phenomena, 1012-0394 ; v. 156-158 |
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Diffusion and defect data. Pt. B, Solid state phenomena ; v. 156/158.
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| Contents |
Gettering and Defect Engineering in Semiconductor Technology XIII; Preface; Committeess; Table of Contents; I. Multi-Crystalline Silicon for Solar Cells; Influence of Defects on Solar Cell Characteristics; Dislocation Engineering in Multicrystalline Silicon; Grain Boundaries in Multicrystalline Si; Analysis of Heterogeneous Iron Precipitation in Multicrystalline Silicon; Growth of Silicon Carbide Filaments in Multicrystalline Silicon for Solar Cells; Analysis of Silicon Carbide and Silicon Nitride Precipitates in Block Cast Multicrystalline Silicon |
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Investigations on the Behaviour of Carbon during Inductive Melting of Multicrystalline SiliconAn Investigation into Fracture of Multi-Crystalline Silicon; II. Advanced Semiconductor Materials: Strained Si, SOI, SiGe, SiC; Strained Silicon Devices; Novel Trends in SOI Technology for CMOS Applications; Advanced Si-based Semiconductors for Energy and Photonic Applications; Si Wafer Bonding: Structural Features of the Interface; Buried Insulating Layer Formation in Cz Si Wafers after Helium Implantation, Nitrogen Plasma Treatment and Annealing |
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Growth of Heavily Phosphorus-Doped (111) Silicon CrystalsSemi-Insulating Silicon for Microwave Devices; III. Impurities (Oxygen, Carbon, Nitrogen, Metals) and Point Defects in Si and SiGe; Can Impurities be Beneficial to Photovoltaics?; Properties of Fast-Diffusing Oxygen Species in Silicon Deduced from the Generation Kinetics of Thermal Donors; The Production of Vacancy-Oxygen Defects in Electron-Irradiated Cz-Si Initially Treated at High Temperatures and High Pressures; Divacancy-Oxygen and Trivacancy-Oxygen Complexes in Silicon: Local Vibrational Mode Studies |
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Low-Temperature Elastic Softening due to Vacancies in Boron-Doped FZ Silicon CrystalsVacancies and Self-Interstitials Dynamics in Silicon Wafers; Interaction of Point Defects with Impurities in the Si-SiO2 System and its Influence on the Properties of the Interface; Anomalous Out-Diffusion Profiles of Nitrogen in Silicon; DLTS Studies of Carbon Related Complexes in Irradiated N- and P-Silicon ; Copper In-Depth Distribution in Hydrogen Implanted Cz Si Wafers Subjected to Two-Step Annealing; Radiation Defects in Silicon: Effect of Contamination by Platinum Atoms |
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Review of Stress Effects on Dopant Solubility in Silicon and Silicon-Germanium LayersOxygen Diffusion in Si1-xGex Alloys; The Effect of Germanium Doping on the Production of Carbon-Related Defects in Electron-Irradiated Czochralski Silicon; IV. Modeling and Simulation of Growth, Gettering and Characterization; Numerical Analysis of mc-Si Crystal Growth; Molecular Simulation on Interfacial Structure and Gettering Efficiency of Si (110)/(100) Directly Bonded Hybrid Crystal Orientation Substrates; Optimization of Silicon Ingot Quality by the Numerical Prediction of Bulk Crystal Defects |
| Summary |
This collection aims to address the fundamental aspects, as well as the technological problems, which are associated with defects in electronic materials and devices. The volume comprises 93 contributions; among them, 14 invited papers, from more than 20 different countries. The invited papers, submitted by internationally recognized experts in the field, review the state-of-the-art and likely future trends in their respective research field. Upon comparing this volume with previous volumes, it is clearly seen that defect engineering in photovoltaics is becoming a topic of ever-increasing inte |
| Bibliography |
Includes bibliographical references and index |
| Notes |
English |
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Print version record |
| Subject |
Semiconductors -- Congresses
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Solid state electronics -- Congresses
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TECHNOLOGY & ENGINEERING -- Engineering (General)
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TECHNOLOGY & ENGINEERING -- Reference.
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Semiconductors
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Solid state electronics
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| Genre/Form |
Conference papers and proceedings
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| Form |
Electronic book
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| Author |
Kittler, Martin.
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Richter, H., 1940-
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| ISBN |
9783038133698 |
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3038133698 |
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