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E-journal
Author IEEE International Workshop on Memory Technology, Design, and Testing

Title Records of the IEEE International Workshop on Memory Technology, Design, and Testing / sponsored by the IEEE Computer Society Technical Committee on Test Technology ; in cooperation with the IEEE Computer Society Technical Committee on VLSI
Published Los Alamitos, Calif. : IEEE Computer Society Press
Began with: Aug. 8-9 (1994)
Online access available from:
IEEE Xplore    01 Jan. 1993-
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Copies

Description Online resource
Notes Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. http://purl.oclc.org/DLF/benchrepro0212 MiAaHDL
digitized 2010 HathiTrust Digital Library committed to preserve pda MiAaHDL
Description based on: 1995; title from pdf image (ieeexplore.ieee.org website, viewed Feb. 14, 2018)
Latest issue consulted: 2009 (viewed Feb. 14, 2018)
Subject Semiconductor storage devices -- Testing -- Congresses
Random access memory -- Congresses
Form Electronic journal
Author IEEE Computer Society. Test Technology Technical Committee
IEEE Computer Society. Technical Committee on VLSI
LC no. 2018201214
ISSN 2576-9154
1087-4852
ABBREV TI Rec. IEEE Int. Workshop Mem. Technol. Des. Test. (Online)
OTHER TI Records of the IEEE International Workshop on Memory Technology, Design, and Testing (Online)
Other Titles Memory Technology, Design, and Testing
... IEEE International Workshop on Memory Technology, Design and Testing (MDTD)