| Description |
1 online resource (605 pages) |
| Contents |
Cover; Related Titles; Title Page; Copyright; List of Contributors; Preface; Part 1: Basics and Methods; Chapter 1: Introduction to Scanning Electron Microscopy; 1.1 Components of the Scanning Electron Microscope; 1.2 Electron-Matter Interaction; 1.3 Contrast Mechanisms; 1.4 Electron Backscattered Diffraction (EBSD); 1.5 Dispersive X-Ray Spectroscopy; 1.6 Other Signals; 1.7 Summary; References; Chapter 2: Conventional and Advanced Electron Transmission Microscopy; 2.1 Introduction; 2.2 High-Resolution Transmission Electron Microscopy; 2.3 Conventional TEM of Defects in Crystals |
|
2.4 Lorentz Microscopy2.5 Off-Axis and Inline Electron Holography; 2.6 Electron Diffraction Techniques; 2.7 Convergent Beam Electron Diffraction; 2.8 Scanning Transmission Electron Microscopy and Z-Contrast; 2.9 Analytical TEM; References; Chapter 3: Dynamic Transmission Electron Microscopy; 3.1 Introduction; 3.2 How Does Single-Shot DTEM Work?; 3.3 Experimental Applications of DTEM; 3.4 Crystallization Under Far-from-Equilibrium Conditions; 3.5 Space Charge Effects in Single-Shot DTEM; 3.6 Next-Generation DTEM; 3.7 Conclusions; Acknowledgments; References |
|
Chapter 4: Formation of Surface Patterns Observed with Reflection Electron Microscopy4.1 Introduction; 4.2 Reflection Electron Microscopy; 4.3 Silicon Substrate Preparation; 4.4 Monatomic Steps; 4.5 Step Bunching; 4.6 Surface Reconstructions; 4.7 Epitaxial Growth; 4.8 Thermal Oxygen Etching; 4.9 Conclusions; Acknowledgments; References; Part 2: Growth and Interactions; Chapter 5: Electron and Ion Irradiation; 5.1 Introduction; 5.2 The Physics of Irradiation; 5.3 Radiation Defects in Solids; 5.4 Setup in the Electron Microscope; 5.5 Experiments; 5.6 Outlook; 5.7 Acknowledgments; References |
|
Chapter 6: Observing Chemical Reactions Using Transmission Electron Microscopy6.1 Introduction; 6.2 Instrumentation; 6.3 Types of Chemical Reaction Suitable for TEM Observation; 6.4 Experimental Setup; 6.5 Available Information Under Reaction Conditions; 6.6 Limitations and Future Developments; Acknowledgements; References; Chapter 7: In-Situ TEM Studies of Vapor- and Liquid-Phase Crystal Growth; 7.1 Introduction; 7.2 Experimental Considerations; 7.3 Vapor-Phase Growth Processes; 7.4 Liquid-Phase Growth Processes; 7.5 Summary; Acknowledgments; References |
|
Chapter 8: In-Situ TEM Studies of Oxidation8.1 Introduction; 8.2 Experimental Approach; 8.3 Oxidation Phenomena; 8.4 Future Developments; 8.5 Summary; References; Part 3: Mechanical Properties; Chapter 9: Mechanical Testing with the Scanning Electron Microscope; 9.1 Introduction; 9.2 Technical Requirements and Specimen Preparation; 9.3 In-Situ Loading of Macroscopic Samples; 9.4 In-Situ Loading of Micron-Sized Samples; 9.5 Summary and Outlook; References; Chapter 10: In-Situ TEM Straining Experiments: Recent Progress in Stages and Small-Scale Mechanics; 10.1 Introduction |
| Summary |
Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiatio |
| Notes |
10.2 Available Straining Techniques |
|
Print version record |
| Subject |
Electron microscopy.
|
|
electron microscopy.
|
|
Electron microscopy
|
| Form |
Electronic book
|
| Author |
Howe, James M
|
|
Zweck, Josef
|
| ISBN |
9783527652181 |
|
3527652183 |
|
