Title Scanning and transmission electron microscopy : an introduction / Stanley L. Flegler, John W. Heckman, Jr., Karen L. Klomparens

Published New York : W.H. Freeman, [1993] ©1993

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Description viii, 225 pages : illustrations ; 27 cm Contents Machine derived contents note: 1. Introduction -- 2. Electron Sources and Electron Lenses -- 2.1. Electron Sources -- 2.2. Electron Lenses -- 3. Vacuum Systems -- 3.1. Vacuum Pumps Commonly Used in EM Labs -- 3.2. Methods of Measuring Vacuums -- 3.3. Vacuum Systems Used in Electron Microscopy -- 4. The Transmission Electron Microscope -- 4.1. Theory of Operation -- 4.2. Real Images -- 4.3. Virtual Images -- 4.4. Depth of Field and Depth of Focus -- 4.5. Anatomy of a Transmission Electron Microscope -- 4.6. Medium- and High-Voltage Transmission Electron Microscopy -- 5. The Scanning Electron Microscope -- 5.1. Theory of Operation -- 5.2. Specimen-Beam Interactions -- 5.3. Machine Variables -- 5.4. Ultrahigh-Resolution SEMS -- 5.5. Environmental SEMS -- 5.7. Scanning Tunneling and Atomic Force Microscopy -- 6. Specimen Preparation for TEM -- 6.1. Negative Staining of Small Particulates -- 6.2. Ultrathin Sectioning of Larger Samples -- 6.3. Vacuum Evaporators and Evaporation Techniques -- 6.4. Shadowcasting and Replica Techniques -- 6.5. Cytological Techniques -- 6.6. Preparation of Nonbiological Materials -- 7. Specimen Preparation for SEM -- 7.1. Mounting -- 7.2. Coating for Conductivity -- 7.3. Special Methods for Various Sample Types -- 7.4. Biological Sample Preparation -- 7.5. Alternative Methods for Biological Samples -- 7.6. SEM Histochemistry for Biological Samples -- 8. X-Ray Analysis -- 8.1. X-ray Production and Naming -- 8.2. Measuring the Energy and Wavelength of X Rays -- 8.3. Construction of the EDS Detector -- 8.4. Construction of the EDS X-Ray Analyzer -- 8.5. Outputs -- 8.6. Spectrum Accumulation and Interpretation -- 8.7. Optimizing the Detection of X Rays -- 8.8. Artifacts -- 8.9. Quantitative Analysis -- 8.10. Sample Preparation -- 9. Electron Micrographic Techniques -- 9.1. Silver Graphic Process -- 9.2. Photographic Printing -- 9.3. Transmission Electron Micrography -- 9.4. Scanning Electron Micrography -- 9.5. The Electronic Darkroom -- 9.6. Micrograph Presentation and Publication Bibliography Includes bibliographical references and index Subject Scanning electron microscopy. Transmission electron microscopy. Author Heckman, John William. Klomparens, Karen L. LC no. 93010483 ISBN 0716770474

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