| Description |
1 online resource (xxii, 464 pages) : illustrations |
| Contents |
Overview of AFM -- Distance-dependent interactions -- Z-dependent force measurements with AFM -- Topographic imaging -- Probing material properties I: phase imaging -- Probing material properties II: adhesive nanomechanics and mapping distance-dependent interactions -- Probing material properties III: lateral force methods -- Data post-processing and statistical analysis -- Spectral methods for measuring the normal cantilever spring constant K -- Derivation of Van der Waals force-distance expressions -- Derivation of energy dissipation expression, relationship to phase -- Relationships in meniscus geometry, circular approximation |
| Summary |
"This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions"--Publisher's description |
| Notes |
Edition statement from first page of chapter PDFs |
| Bibliography |
Includes bibliographical references and index |
| Notes |
Print version record |
| Subject |
Atomic force microscopy.
|
|
SCIENCE -- Nanoscience.
|
|
TECHNOLOGY & ENGINEERING -- Nanotechnology & MEMS.
|
|
Atomic force microscopy
|
|
Rasterkraftmikroskopie
|
| Form |
Electronic book
|
| LC no. |
2012003429 |
| ISBN |
9781118360668 |
|
1118360664 |
|
9781118360699 |
|
1118360699 |
|
9781283646024 |
|
1283646021 |
|
9786613958525 |
|
6613958522 |
|
