| Description |
1 online resource : text file, PDF |
| Contents |
Cover; Half Title; Title; Copyrights; Contents; Preface; 1 Introduction; 2 The THz Frequency Range; 2.1 Definitions; 2.2 Distinguishing Features of THzWave-Matter Interactions; 2.3 Present and Foreseen Applications of THzWaves; 2.3.1 Security; 2.3.1.1 Passive and active imaging; 2.3.1.2 Hyper-spectral imaging; 2.3.2 Biology; 2.3.3 Medicine; 2.3.4 Sensing in Industrial Applications; 2.3.5 Environment; 2.3.6 THz Telecoms; 2.3.7 Scientific Instrumentation; 2.3.7.1 In laboratories; 2.3.7.2 Radioastronomy; 2.4 The Need for a Precise Characterization of Materials and Devices |
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2.5 Classical Optical Techniques to Determine the Refractive Index of a Material2.5.1 Refractometry: Angle of Deviation; 2.5.2 Refractometry: Limit Angle; 2.5.3 Ellipsometry; 2.5.4 Interferometric Methods; 2.6 Classical Optical Techniques Used to Determine the Absorption of a Material; 2.7 Microwaves Techniques; 2.8 The Amazing Time-Domain Technique; 3 Classical Far-Infrared Spectroscopy Techniques; 3.1 Introduction; 3.2 Basic Definitions in Spectroscopy; 3.2.1 Resolving Spectral Power; 3.2.2 Spectrometer Throughput; 3.2.3 Signal-to-Noise Ratio; 3.3 Continuous or Quasi-Continuous Sources |
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3.3.1 Blackbody Emitters3.3.2 Diodes with a Negative Differential Resistance (NDR); 3.3.3 Schottky Diode Multiplier; 3.3.4 Electronic Tubes; 3.3.5 Optically Driven UTC Diodes; 3.3.6 Other Sources and Future Sources; 3.4 Large-Band Detectors; 3.4.1 General Definitions; 3.4.2 Basic Equations of Detection; 3.4.3 The Different Types of Detectors; 3.5 Spectrometers; 3.6 Fourier-Transform Infrared Spectroscopy; 4 THz-TDS Instrumentation; 4.1 Introduction; 4.2 THz Pulse Generation by Optoelectronic Means; 4.2.1 Photo-conducting Antenna; 4.2.2 Emission at the Surface of a Semiconductor Wafer |
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4.2.3 Optical Rectification in Electro-optic Crystals4.3 THz Pulse Detection; 4.3.1 Photo-conducting Detectors; 4.3.2 Electro-optic Detection; 4.4 The Principle of Equivalent Time Sampling; 4.5 From Time-Domain to Frequency Domain; 4.6 THz-TDS Setups; 4.6.1 Common Systems Based on Photo-conducting Antennas; 4.6.2 Common Systems Based on Electro-optic Crystals; 4.6.4 "Poor Man's" (Cost-Effective) Systems; 4.6.5 Single-Shot THz-TDS Systems; 4.6.3 ASOPS Systems; 5 Extracting the Complex Refractive Index from Transmission TDS Data; 5.1 Introduction; 5.2 Method by Duvillaret, Garet, and Coutaz |
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5.3 Derived Methods5.4 Samples of Different Thicknesses Made with the Same Material; 5.5 Thin Films; 5.5.1 Stand-Alone Thin Films; 5.5.2 Thin Films Deposited over a Substrate; 5.5.3 Metallic and Highly Conducting Thin Films; 5.6 Thick Samples; 5.7 Layered Samples; 5.8 Parametric Methods; 5.9 Extraction in the Time Domain; 6 Extracting the Refractive Index from Reflection TDS Data; 6.1 Introduction; 6.2 Parametric Method; 6.3 Optically Thick Samples; 6.4 Reflection THz-TDS for Characterization of Liquids; 6.5 Attenuated Total Reflection (ATR) THz-TDS; 6.6 Ellipsometry |
| Bibliography |
Includes bibliographical references and index |
| Notes |
Online resource; title from PDF title page (EBSCO, viewed December 3, 2018) |
| Subject |
Terahertz spectroscopy.
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SCIENCE -- Chemistry -- Analytic.
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Terahertz spectroscopy.
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| Form |
Electronic book
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| Author |
Garet, Frederic, author
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Wallace, Vincent P., author
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| ISBN |
9780203709696 |
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0203709691 |
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9781351356374 |
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9781351356367 |
|
1351356364 |
|
9781351356350 |
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1351356372 |
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1351356356 |
|
