| Description |
1 online resource (163 pages) : illustrations |
| Contents |
1. Introduction -- 2. Scanning Tunneling Microscopy (STM) -- 3. Atomic Force Microscopy -- 4. Manipulation of Atoms and Atom Clusters on the Nanoscale -- 5. Spin-Offs of STM -- Non-Contact Nanoscale Probes -- 6. Acknowledgements -- 7. References |
| Summary |
Materials scientists, surface scientists, electrochemists, as well as scientists working in catalysis and microelectronics will find this book an invaluable source of information. Inclusion of introductory material makes the book suitable also for graduate students and newcomers to the field |
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Topics include: STM, AFM, semiconductor surfaces and interfaces, insulators, layered compounds, charge density wave systems, superconductors, electrochemistry at liquid-solid interfaces, biological systems, metrological applications, nanoscale surface forces, nanotribology, and manipulation on the nanoscale |
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Derived from the highly acclaimed series Materials Science and Technology, this book provides in-depth coverage of STM, AFM, and related non-contact nanoscale probes along with detailed applications, such as the manipulation of atoms and clusters on a nanometer scale. The techniques are described in terms of the physics and the technology of the methods and many high-quality images demonstrate the power of these techniques in the investigation of surfaces and the processes which occur on them |
| Bibliography |
Includes bibliographical references (pages 151-158) and index |
| Notes |
Print version record |
| Subject |
Nanotechnology.
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Scanning tunneling microscopy.
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Surfaces (Physics)
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| Form |
Electronic book
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| ISBN |
3527615946 (electronic bk.) |
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9783527615940 (electronic bk.) |
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