| Description |
1 online resource |
| Series |
Quantitative software engineering series |
|
Quantitative software engineering series.
|
| Contents |
Microstructural Characterization of Materials; Contents; Preface to the Second Edition; Preface to the First Edition; 1 The Concept of Microstructure; 2 Diffraction Analysis of Crystal Structure; 3 Optical Microscopy; 4 Transmission Electron Microscopy; 5 Scanning Electron Microscopy; 6 Microanalysis in Electron Microscopy; 7 Scanning Probe Microscopy and Related Techniques; 8 Chemical Analysis of Surface Composition; 9 Quantitative and Tomographic Analysis of Microstructure; Appendices; Index |
| Summary |
Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this p |
| Bibliography |
Includes bibliographical references and index |
| Notes |
Print version record |
| Subject |
Materials -- Microscopy.
|
|
Microstructure.
|
| Form |
Electronic book
|
| Author |
Kaplan, Wayne D.
|
|
Wiley InterScience (Online service)
|
| ISBN |
0470027843 |
|
0470727128 (electronic bk.) |
|
0470727136 |
|
9780470027844 |
|
9780470727126 (electronic bk.) |
|
9780470727133 |
|
(paperback) |
|
(paperback) |
|
